Citations are generated automatically from bibliographic data as a convenience and may not be complete or accurate.
National Institute of Standards and Technology (NIST), Commerce Department. "Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report January 1 to March 31, 1969". Government. Commerce Department, July 1, 1969. https://www.govinfo.gov/app/details/GOVPUB-C13-eab0691f2aa23376e843180bfb2bc67e
National Institute of Standards and Technology (NIST), Commerce Department. (1969, July 1). Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report January 1 to March 31, 1969. [Government]. Commerce Department. https://www.govinfo.gov/app/details/GOVPUB-C13-eab0691f2aa23376e843180bfb2bc67e
National Institute of Standards and Technology (NIST), Commerce Department. Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report January 1 to March 31, 1969. Commerce Department, (1 Jul 1969), https://www.govinfo.gov/app/details/GOVPUB-C13-eab0691f2aa23376e843180bfb2bc67e
National Institute of Standards and Technology (NIST), Commerce Department, Methods of Measurement for Semiconductor Materials, Process Control, and Devices, GovInfo, (July 1, 1969), https://www.govinfo.gov/app/details/GOVPUB-C13-eab0691f2aa23376e843180bfb2bc67e