[Federal Register Volume 82, Number 114 (Thursday, June 15, 2017)]
[Notices]
[Page 27468]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2017-12406]


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DEPARTMENT OF COMMERCE

International Trade Administration


Purdue University, et al.; Notice of Decision on Application for 
Duty-Free Entry of Scientific Instruments

    This is a decision pursuant to Section 6(c) of the Educational, 
Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89-
651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301). 
Related records can be viewed between 8:30 a.m. and 5:00 p.m. in Room 
3720, U.S. Department of Commerce, 14th and Constitution Ave. NW., 
Washington, DC.
    Docket Number: 16-004. Applicant: Purdue University, West 
Lafayette, IN 47907. Instrument: SGR YAG pulsed laser. Manufacturer: 
Beamtech Optronics, Co., LTD, China. Intended Use: See notice at 81 FR 
71702, October 18, 2016. Comments: None received. Decision: Approved. 
We know of no instruments of equivalent scientific value to the foreign 
instruments described below, for such purposes as this is intended to 
be used, that was being manufactured in the United States at the time 
of order. Reasons: The instrument will be used for pulsed laser 
annealing and nanostructure integrated laser shock peening, to improve 
the microstructure of thin film for better electrical and optical 
properties. Requirements for the experiment include three wave lengths 
(355nm, 532nm, 1064 nm), pulse energy 2J, flat hat beam, and pulse 
duration tunable from 10ns to 25ns.
    Docket Number: 16-008. Applicant: California Institute of 
Technology, Pasadena, CA 91125. Instrument: Cryogenic Temperature 
Scanning Tunneling Microscope System. Manufacturer: Unisoku Co., LTD., 
Japan. Intended Use: See notice at 81 FR 71703, October 18, 2016. 
Comments: None received. Decision: Approved. We know of no instruments 
of equivalent scientific value to the foreign instruments described 
below, for such purposes as this is intended to be used, that was being 
manufactured in the United States at the time of order. Reasons: The 
instrument will be used to investigate structural and electrical 
surface properties with atomic resolution at cryogenic temperatures (-
459 Fahrenheit--0.4 K) and high magnetic fields, at which conditions 
materials can exhibit unusual quantum properties such as topological 
superconductivity and fractionalization of charge carriers. Experiments 
to be conducted with the instrument include mapping of the local 
electronic density of states of gated nanostructures by measuring 
current--voltage curves at different points, mapping of the electron 
spin structure using scanning tips made of magnetic materials, and 
probing the size of the energy gap in topological insulators and 
topological superconductors. For this type of research an instrument 
capable of performing scanning tunneling microscopy (STM) and atomic 
force microscopy (AFM) at cryogenic temperatures and high magnetic 
fields is essential.

    Dated: June 9, 2017.
Gregory W. Campbell,
Director, Subsidies Enforcement, Enforcement and Compliance.
[FR Doc. 2017-12406 Filed 6-14-17; 8:45 am]
 BILLING CODE 3510-DS-P