[Federal Register Volume 81, Number 26 (Tuesday, February 9, 2016)]
[Notices]
[Pages 6831-6832]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2016-02552]


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DEPARTMENT OF COMMERCE

International Trade Administration


University of Kentucky, et al.; Notice of Consolidated Decision 
on Applications for Duty-Free Entry of Electron Microscope

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR 
part 301). Related records can be viewed between 8:30 a.m. and 5:00 
p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution 
Avenue NW., Washington, DC.
    Docket Number: 15-001. Applicant: University of Kentucky, 
Lexington, KY 40506-0046. Instrument: Electron Microscope. 
Manufacturer: FEI Company, Czech Republic. Intended

[[Page 6832]]

Use: See notice at 80 FR 2914-15, January 21, 2015.
    Docket Number: 15-029. Applicant: University of California, Irvine, 
Irvine, CA 92697-2575. Instrument: Electron Microscope. Manufacturer: 
JEOL Ltd., Japan. Intended Use: See notice at 80 FR 65984, October 28, 
2015.
    Docket Number: 15-031. Applicant: University of California, Irvine, 
Irvine, CA 92697-2575. Instrument: Electron Microscope. Manufacturer: 
JEOL Ltd., Japan. Intended Use: See notice at 80 FR 65984, October 28, 
2015.
    Docket Number: 15-035. Applicant: Drexel University, Philadelphia, 
PA 19104. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., 
Japan. Intended Use: See notice at 80 FR 65984, October 28, 2015.
    Docket Number: 15-036. Applicant: The Trustees of Princeton 
University, Princeton, NJ 08540. Instrument: Electron Microscope. 
Manufacturer: FEI Czech Republic s.r.o., Czech Republic. Intended Use: 
See notice at 80 FR 65984, October 28, 2015.
    Docket Number: 15-037. Applicant: The Trustees of Princeton 
University, Princeton, NJ 08540. Instrument: Electron Microscope. 
Manufacturer: FEI Electron Optics BV, the Netherlands. Intended Use: 
See notice at 80 FR 65984, October 28, 2015.
    Docket Number: 15-038. Applicant: South Dakota State University, 
Brookings, SD 57007. Instrument: Electron Microscope. Manufacturer: 
JEOL Ltd., Japan. Intended Use: See notice at 80 FR 65984, October 28, 
2015.
    Docket Number: 15-039. Applicant: University of Texas Southwestern 
Medical Center, Dallas, TX 75390. Instrument: Electron Microscope. 
Manufacturer: FEI Company, the Netherlands. Intended Use: See notice at 
80 FR 65984-85, October 28, 2015.
    Docket Number: 15-040. Applicant: UT Battelle, Oak Ridge National 
Laboratory, Oak Ridge TN 37831-6138. Instrument: Electron Microscope. 
Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 
80 FR 65984-85, October 28, 2015.
    Docket Number: 15-043. Applicant: New York Structural Biology 
Center, New York, NY 10027. Instrument: Electron Microscope. 
Manufacturer: FEI Co., the Netherlands. Intended Use: See notice at 80 
FR 65984-85, October 28, 2015.
    Docket Number: 15-046. Applicant: National Institute for 
Occupational Safety & Health, Morgantown, WV 26505. Instrument: 
Electron Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: See 
notice at 80 FR 65984-85, October 28, 2015.
    Docket Number: 15-048. Applicant: Battelle/Pacific Northwest 
National Laboratory, Richland, WA 99352. Instrument: Electron 
Microscope. Manufacturer: FEI Co., Czech Republic. Intended Use: See 
notice at 80 FR 79307, December 21, 2015.
    Docket Number: 15-053. Applicant: University of California at San 
Diego, La Jolla, CA 92093-0651. Instrument: Electron Microscope. 
Manufacturer: FEI Company, the Netherlands. Intended Use: See notice at 
80 FR 79307-08, December 21, 2015.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as this instrument is intended to be used, is being 
manufactured in the United States at the time the instrument was 
ordered. Reasons: Each foreign instrument is an electron microscope and 
is intended for research or scientific educational uses requiring an 
electron microscope. We know of no electron microscope, or any other 
instrument suited to these purposes, which was being manufactured in 
the United States at the time of order of each instrument.

    Dated: February 3, 2016.
Gregory W. Campbell,
Director, Subsidies Enforcement Office, Enforcement and Compliance.
[FR Doc. 2016-02552 Filed 2-8-16; 8:45 am]
BILLING CODE 3510-DS-P