[Federal Register Volume 80, Number 244 (Monday, December 21, 2015)]
[Notices]
[Pages 79307-79308]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2015-31999]


-----------------------------------------------------------------------

DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before (Insert date 20 days after 
publication in the Federal Register). Address written comments to 
Statutory Import Programs Staff, Room 3720, U.S. Department of 
Commerce, Washington, DC 20230. Applications may be examined between 
8:30 a.m. and 5:00 p.m. at the U.S. Department of Commerce in Room 
3720.

    Docket Number: 15-048. Applicant: Battelle/Pacific Northwest 
National Laboratory, 790 6th Street, Richland, WA 99352. Instrument: 
Electron Microscope. Manufacturer: FEI, Co., Czech Republic. Intended 
Use: The instrument will be used to study radioactive ceramic and 
metallic materials including irradiated fuel-type materials. 
Justification for Duty-Free Entry: There are no instruments of the same 
general category manufactured in the United States. Application 
accepted by Commissioner of Customs: October 30, 2015.

    Docket Number: 15-050. Applicant: Rutgers University, 89 French 
Street, New Brunswick, NJ 08901. Instrument: Junior Micromanipulator 
unit with remote control system, shifting table and chamber unit parts. 
Manufacturer: Luigs & Neumann, Germany. Intended Use: The instrument 
will be used to simultaneously measure the microscopic electric signals 
generated from neurons, specifically the patch-clamp whole cell 
recordings from neurons, to identify specific alterations in synaptic 
transmission that leads to neuropsychiatric or neurological disorders. 
The instrument is a highly flexible, highly precise system, offering 
the highest mechanical resolution and smoothest movement because of its 
patented spindle nut system, which guarantees a unique and 
extraordinary stability for long term recordings. The step motor is 
decoupled preventing a thermal bridge from the motor to the machine and 
also prevents vibration

[[Page 79308]]

during movement. The experiments require high precision equipment to 
precisely determine the measurement of voltage in the mV range and 
current in the pA range. Justification for Duty-Free Entry: There are 
no instruments of the same general category manufactured in the United 
States. Application accepted by Commissioner of Customs: October 30, 
2015.

    Docket Number: 15-053. Applicant: University of California at San 
Diego, 9500 Gilman Drive, MC 0651, GPL Building, Room H204, La Jolla, 
CA 92093-0651. Instrument: Electron Microscope. Manufacturer: FEI 
Company, the Netherlands. Intended Use: The instrument will be used to 
determine three-dimensional structures of macromolecules to understand 
their normal functions in the cell and thus how these functions are 
altered in disease states. Justification for Duty-Free Entry: There are 
no instruments of the same general category manufactured in the United 
States. Application accepted by Commissioner of Customs: November 2, 
2015.

    Dated: December 14, 2015.
Gregory W. Campbell,
Director of Subsidies Enforcement, Enforcement and Compliance.
[FR Doc. 2015-31999 Filed 12-18-15; 8:45 am]
BILLING CODE 3510-DS-P