[Federal Register Volume 80, Number 13 (Wednesday, January 21, 2015)]
[Notices]
[Pages 2914-2916]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2015-00936]


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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before February 10, 2015. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5:00 p.m. at the U.S. Department of 
Commerce in Room 3720.
    Docket Number: 14-031. Applicant: Harvard University, 11 Oxford 
St., Cambridge, MA 02138. Instrument: Electron Microscope. 
Manufacturer: JEOL Ltd., Japan. Intended Use: The instrument will be 
used to examine the

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properties of materials and physics associated with nanoscale materials 
systems, such as semi-conducting systems found in computers and 
electronic devices fabricated from carbon, silicon, silicon-oxide, 
germanium and metals such as copper, gold, platinum, aluminum, aluminum 
oxide and ruthenium. The properties studied will include materials 
composition chemical analysis, electronic band structure, density of 
states and dopant atoms distribution. Justification for Duty-Free 
Entry: There are no instruments of the same general category 
manufactured in the United States. Application accepted by Commissioner 
of Customs: November 17, 2014.
    Docket Number: 14-032. Applicant: New Mexico Institute of Mining 
and Technology, 801 Leroy Place, Socorro, NM 87801. Instrument: 
DelayLine Trolley (DLT). Manufacturer: University of Cambridge/
Cavendish Lab, United Kingdom. Intended Use: The instrument will be 
used within the Magdalena Ridge Observatory Interferometer (MROI) to 
equalize path lengths traveled by the light from a target object, via 
the telescopes, to the point where interference takes place, by acting 
as a continuously movable retro-reflector. Each trolley moves 
continuously within an evacuated pipe in order to introduce the optical 
path delay appropriate for the target, time of observation, and inter-
telescope separations in use. For most of the sky to be accessible, a 
delay range approximately equal to the longest inter-telescope 
separation must be available, requiring an unprecedented monolithic 
delay line length of almost 200m. The instrument is essentially a 
cat's-eye assembly that is flexure-mounted and voice coil actuated on a 
motorized wheeled carriage, which runs directly on the inner surface of 
the delay line pipe, not on pre-installed rails. Its position is 
precisely measured by a laser metrology system and computer controlled 
so as to introduce the appropriate optical path compensation as a 
function of time. The following specifications are required for the 
research: a focus on model-independent imaging as opposed to 
astrometric or precision phase or visibility measurement, a wavelength 
of operation that covers both the visible and near infrared, between 
600 nm and 2400 nm, accommodation for baseline lengths as long as 250m, 
a concern for polarization fidelity in the image, and a requirement to 
reach a limiting group-delay tracking magnitude of H=14 to allow 
observations of extragalactic targets while tracking on the science 
object rather than a nearby reference star. Justification for Duty-Free 
Entry: There are no instruments of the same general category 
manufactured in the United States. Application accepted by Commissioner 
of Customs: November 14, 2014.
    Docket Number: 14-033. Applicant: University of South Carolina 
School of Medicine, 6439 Garner's Ferry Road, Columbia, SC 29208. 
Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. 
Intended Use: The instrument will be used to examine the 
ultrastructural changes in cells and tissues in response to a disease 
process and subsequent treatment of the disease through a variety of 
protocols, in biomedical research samples such as heart, colon, and 
skeletal muscle, to study cardiovascular disease, cancer and 
inflammation. Justification for Duty-Free Entry: There are no 
instruments of the same general category manufactured in the United 
States. Application accepted by Commissioner of Customs: November 26, 
2014.
    Docket Number: 14-034. Applicant: National Institutes of Health, 50 
South Dr., Bldg. 50, Rm. 1517, Bethesda, MD 20892-8025. Instrument: 
Falcon II Direct Detection Camera. Manufacturer: FEI Company, the 
Netherlands. Intended Use: The instrument will be used in cryo-electron 
microscopy experiments, to visualize biological specimens suspended in 
vitreous ice involving recording electron micrographs of the highest 
possible quality and subjecting them to digital image analysis to 
elicit the maximum amount of structural information and interpretation, 
taking into account all pertinent complimentary data. Sensor 
specifications required for this research include a pixel size of ~14 
[mu]m which predicates a magnification of ~100 kx, optimal performance 
as measured by Detective Quantum Efficiency at a typical dose rate of 
10-20 e/pixel/second, and protection of the sensor against accidental 
high-dose exposures to the microscope's electron beam. Justification 
for Duty-Free Entry: There are no instruments of the same general 
category manufactured in the United States. Application accepted by 
Commissioner of Customs: December 19, 2014.
    Docket Number: 14-036. Applicant: University of Michigan, 109 Zina 
Pitcher Place, Ann Arbor, Michigan 48109-2200. Instrument: Electron 
Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: The 
instrument will be used to study tissue and cells to assist in the 
understanding of cancer cells, morphology, and general histochemical 
analysis, using diffraction analysis of organic compounds. 
Justification for Duty-Free Entry: There are no instruments of the same 
general category manufactured in the United States. Application 
accepted by Commissioner of Customs: December 19, 2014.
    Docket Number: 14-037. Applicant: University of Arizona, 1629 E. 
University Blvd., Tucson, AZ 85721. Instrument: Electron Microscope. 
Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument 
will be used to characterize the structural and compositional 
properties of a wide variety of materials including meteorites, samples 
of the moon, solar cell structures, polymers, thin-film semiconductors 
and other technologically relevant materials, in order to determine the 
origins of our solar system and the moon and the underlying physics of 
technologically relevant materials for solar cells and optical devices. 
Justification for Duty-Free Entry: There are no instruments of the same 
general category manufactured in the United States. Application 
accepted by Commissioner of Customs: December 19, 2014.
    Docket Number: 14-038. Applicant: University of North Dakota, 243 
Centennial Drive, Stop 8153, Grand Forks, ND 58202-8153. Instrument: 
Electron Microscope. Manufacturer: FEI Company, Czech Republic. 
Intended Use: The instrument will be used to understand ore mineralogy 
and texture from upstream ore characterization and metallurgical 
testing to mineral and drilling processing, as well as to create 
digital mineral and texture maps of cores, rocks, soil and sediment. 
The instrument will provide surficial topo-morphological image 
analysis, lithotype, porosity characteristics and texture properties, 
accompanying quantitative chemical composition analysis made possible 
by the equipped EDS detector. Justification for Duty-Free Entry: There 
are no instruments of the same general category manufactured in the 
United States. Application accepted by Commissioner of Customs: 
December 23, 2014.
    Docket Number: 15-001. Applicant: University of Kentucky, 177 
Anderson Tower, Lexington, KY 40506-0046. Instrument: Electron 
Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: 
The instrument will be used to characterize the structure and 
morphology of materials such as metals and alloys, ceramic materials, 
polymers, and biological samples. The instrument includes a Focused Ion 
Beam (FIB) column for milling away material and achieving

[[Page 2916]]

high spatial precision (2.5nm resolution for the FIB beam), as well as 
cutting cross-sectional trenches into samples for characterization of 
the internal structure. Justification for Duty-Free Entry: There are no 
instruments of the same general category manufactured in the United 
States. Application accepted by Commissioner of Customs: January 5, 
2015.

    Dated: January 13, 2015.
Gregory W. Campbell,
Director of Subsidies Enforcement, Enforcement and Compliance.
[FR Doc. 2015-00936 Filed 1-20-15; 8:45 am]
BILLING CODE 3510-DS-P