[Federal Register Volume 79, Number 205 (Thursday, October 23, 2014)]
[Notices]
[Pages 63382-63383]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2014-25256]


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DEPARTMENT OF COMMERCE

International Trade Administration


The Research Corporation of the University of Hawaii, et al.; 
Notice of Consolidated Decision on Applications for Duty-Free Entry of 
Electron Microscope

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR 
part 301). Related records can be viewed between 8:30 a.m. and 5:00 
p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution 
Avenue NW., Washington, DC.
    Docket Number: 14-014. Applicant: The Research Corporation of the 
University of Hawaii, Honolulu, HI 96822. Instrument: Electron 
Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: 
See notice at 79 FR 54680, September 12, 2014.
    Docket Number: 14-017. Applicant: Chehalis School District, 
Chehalis, WA 98532. Instrument: Electron Microscope. Manufacturer: 
Tescan, S.R.O., Czech Republic. Intended Use: See notice at 79 FR 
48123, August 15, 2014.
    Docket Number: 14-018. Applicant: University of Chicago, Chicago, 
IL 60637. Instrument: Electron Microscope. Manufacturer: Brno, Czech 
Republic. Intended Use: See notice at 79 FR 48123, August 15, 2014.
    Docket Number: 14-020. Applicant: Louisiana State University, 
Shreveport, LA 71115. Instrument: Electron Microscope. Manufacturer: 
Delong Instruments A.s., Czech Republic. Intended Use: See notice at 79 
FR 54680, September 12, 2014.
    Docket Number: 14-022. Applicant: University of Nebraska-Lincoln, 
Lincoln, NE 68588-0645. Instrument: Electron Microscope. Manufacturer: 
FEI Company, the Netherlands. Intended Use: See notice at 79 FR 54680-
81, September 12, 2014.
    Docket Number: 14-025. Applicant: Michigan State University, Grand 
Rapids, MI 49503. Instrument: Electron Microscope. Manufacturer: JEOL 
Ltd., Japan. Intended Use: See notice at 79 FR 54680-81, September 12, 
2014.

    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as this instrument is intended to be used, is being 
manufactured in the United States at the time the instrument was 
ordered. Reasons: Each foreign instrument is an electron microscope and 
is intended for

[[Page 63383]]

research or scientific educational uses requiring an electron 
microscope. We know of no electron microscope, or any other instrument 
suited to these purposes, which was being manufactured in the United 
States at the time of order of each instrument.

    Dated: October 16, 2014.
Gregory W. Campbell,
Director, Subsidies Enforcement Office, Enforcement and Compliance.
[FR Doc. 2014-25256 Filed 10-22-14; 8:45 am]
BILLING CODE 3510-DS-P