[Federal Register Volume 79, Number 154 (Monday, August 11, 2014)]
[Notices]
[Pages 46773-46774]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2014-18953]


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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before September 2, 2014. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5:00 p.m. at the U.S. Department of 
Commerce in Room 3720.
    Docket Number: 14-013. Applicant: Howard Hughes Medical University, 
4000 Jones Bridge Road, Chevy Chase, MD 20815. Instrument: Vitrobot 
Vitrification Robot for Cryopreservation. Manufacturer: FEI, Czech 
Republic. Intended Use: The instrument is used to produce high-quality 
frozen-hydrated biological specimens for observation in cryo-TEM, to 
determine the structure of macromolecular biological complexes. It is 
equipped with an environmental chamber and fully automated control of 
blotting and plunge-freezing conditions. The computerized control of 
the humidity/temperature environment specimen chamber and blotting/
freezing conditions is essential to reproducibly obtaining high quality 
samples for TEM, free of freezing artifacts. Justification for Duty-
Free Entry: There are no instruments of the same general category 
manufactured in the United States. Application accepted by Commissioner 
of Customs: June 26, 2014.
    Docket Number: 14-015. Applicant: South Dakota State University, 
Room 214 Daktronics Engineering Hall, South Dakota State University, 
Brookings, SD 57007. Instrument: SUNALE R-150 Atomic Layer Deposition 
Reactor. Manufacturer: Picosun, Finland. Intended Use: The instrument 
will be used to obtain ultrathin dielectric films with full coverage of 
semiconductor device surface to prevent electric leakage, and fabricate 
amorphous metal thin films, by depositing oxide films onto metal layer 
surfaces and studying the effect of the diode, in order to study film 
uniformity, adhesion, dielectric constant, and optical constants. 
Unique features of the instrument include a dual vacuum chamber, which 
allows different reaction chambers to be fit into the same vacuum 
chamber, allowing easy scale up to batch process and deposition on 
different substrates, source lines that are pre-heated before entering 
the reactor chamber, improving the deposition quality, and the option 
of ultra-high vacuum system by using metal seal flanges. Another unique 
feature is the hot-wall reaction chamber, which allows a metal-metal 
sealing surface and pressure control that keeps all process gases 
inside the reaction chamber with no condensation occurring in the 
vacuum chamber walls. The reaction chamber walls are at the same 
temperature as the substrate which prevents secondary reaction routes 
inside the reaction chamber that would result in the loss of self-
limited growth mechanism of ALD, ensures no corrosion occurs on the 
vacuum chamber walls, and ensures the best particle performance and 
long maintenance cycles, and a maximum deposition temperature of 500 
degrees Celsius. Justification for Duty-Free Entry: There are no 
instruments of the same general category manufactured in the United 
States. Application accepted by Commissioner of Customs: July 1, 2014.
    Docket Number: 14-019. Applicant: New Mexico Institute of Mining 
and Technology, 801 Leroy Place, Socorro, NM 87801. Instrument: Tip-
Tilt/Narrow-field Acquisition System (FTT/NSA). Manufacturer: 
University of Cambridge--Cavendish Labs, United Kingdom. Intended Use: 
The instrument will be used to acquire the astronomical target by 
sensing its location in a moderate field of view image and using the 
position of the target relative to a pre-determined location in the 
sensor field of view to provide signals used to adjust the pointing of 
the telescope, and thereafter to detect and eliminate rapid tip-tilt 
(i.e. angle of arrival) fluctuations in the incoming light beam due to 
atmospheric turbulence--sensing these again by measuring the position 
of the target relative to a pre-determined location in the sensor field 
and using these measurements to send high frequency control signals to 
the active secondary mirror of the telescope and low frequency pointing 
corrections to the telescope mount. The unique features of the 
instrument are the interferometer system which is designed to fulfill 
the Science Reference Mission, including a focus on model-independent 
imaging as opposed to

[[Page 46774]]

astrometric or precision phase or visibility measurement, which implies 
the ability to relocate the telescope, in particular the provision of a 
close-packed array configuration with shortest inter-telescope 
separations of 7.8 m. Another unique feature is the ability to reach 
limiting magnitudes of H = 14 for group delay fringe tracking and V = 
16 for tip-tilt sensing to allow observations of extragalactic targets 
(in particular AGN, which have red colors). Other unique features 
include a dual role as a tip-tilt (angle of arrival) correction system 
and target acquisition system, for which a 60'' field of view is 
required, a level of opto-mechanical stability such that the change in 
the effective tip-tilt zero point is less than 0.015'' on the sky for a 
5 degree Celsius change in ambient temperature, which implies sub-
micron stability of the components of the system over the course of a 
night, a limiting sensitivity of 16th magnitude at visual wavelengths 
(limiting magnitude V = 16 for target acquisition and residual tilt in 
fast tip-tilt mode < 0.060'' at V = 16), and the ability to maintain 
the surface temperature of FTT/MSA components close to the light beam 
path within 2 degrees Celsius of ambient, which, coupled with the wide 
operating temperature range, requires the camera to be housed in a 
special environmentally-controlled enclosure. Justification for Duty-
Free Entry: There are no instruments of the same general category 
manufactured in the United States. Application accepted by Commissioner 
of Customs: July 3, 2014.

    Dated: August 4, 2014.
Gregory W. Campbell,
Director of Subsidies Enforcement, Enforcement and Compliance.
[FR Doc. 2014-18953 Filed 8-8-14; 8:45 am]
BILLING CODE 3510-DS-P