[Federal Register Volume 78, Number 127 (Tuesday, July 2, 2013)]
[Notices]
[Page 39712]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2013-15883]


-----------------------------------------------------------------------

DEPARTMENT OF COMMERCE

International Trade Administration


University of Illinois, et al.; Notice of Decision on 
Applications for Duty-Free Entry of Scientific Instruments

    This is a decision pursuant to Section 6(c) of the Educational, 
Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89-
651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301). 
Related records can be viewed between 8:30 a.m. and 5:00 p.m. in Room 
3720, U.S. Department of Commerce, 14th and Constitution Ave, NW., 
Washington, DC.
    Docket Number: 13-007. Applicant: University of Illinois, Urbana, 
IL 61801. Instrument: Electron Microscope. Manufacturer: FEI Company, 
Czech Republic. Intended Use: See notice at 78 FR 20614-20615, April 5, 
2013. Comments: None received. Decision: Approved. We know of no 
instruments of equivalent scientific value to the foreign instruments 
described below, for such purposes as this is intended to be used, that 
was being manufactured in the United States at the time of its order. 
Reasons: The instrument will be used to seek the measurement and 
potentially direct-tailoring of materials properties, through the study 
of the relation of structure to catalytic activity, strain and 
composition within nanostructures, the effects of impurities on the 
strength of materials, and other properties of catalytic materials such 
as Pt, Ru, and Mo, semiconductor nanostructures (Si, Ge, InAs), metal 
alloys such as Ni/Al, and other materials.
    Docket Number: 13-010. Applicant: University of Pittsburgh, 
Pittsburgh, PA 15261. Instrument: Electron Microscope. Manufacturer: 
FEI Czech Republic. Intended Use: See notice at 78 FR 20614-20615, 
April 5, 2013. Comments: None received. Decision: Approved. We know of 
no instruments of equivalent scientific value to the foreign 
instruments described below, for such purposes as this is intended to 
be used, that was being manufactured in the United States at the time 
of its order. Reasons: The instrument will be used to gain a better 
understanding of the relationship between microstructure and the 
performance of materials, through the analysis of crystallographic 
texture, the identification of crystallographic orientation 
relationships between precipitates and the matrix, precipitate size 
distributions and the analysis of chemical compositions of electronic 
materials, advanced ceramics for medical applications, advanced Ni-
based Superalloys, stainless steels (for energy applications), advanced 
high-strength steels, and many other materials.
    Docket Number: 13-011. Applicant: National Institutes of Health, 
Bethesda, MD 20892. Instrument: Electron Microscope. Manufacturer: JEOL 
Ltd., Japan. Intended Use: See notice at 78 FR 20614-20615, April 5, 
2013. Comments: None received. Decision: Approved. We know of no 
instruments of equivalent scientific value to the foreign instruments 
described below, for such purposes as this is intended to be used, that 
was being manufactured in the United States at the time of its order. 
Reasons: The instrument will be used to help understand how the human 
body functions normally, such as in learning, memory or hearing, and to 
understand the pathologies of human diseases. In order to understand 
these functions, this instrument will be used in experiments such as 
identifying the molecular components of a structure in an adult and in 
development, as well as looking for changes in the structure brought on 
by disease or by normal functional changes in cells of living organisms 
such as nerve cells or neurons of the brain, as well as inner ear 
cells.

    Dated: June 26, 2013.
Gregory W. Campbell,
Director, Subsidies Enforcement Office, Import Administration.
[FR Doc. 2013-15883 Filed 7-1-13; 8:45 am]
BILLING CODE 3510-DS-P