[Federal Register Volume 78, Number 66 (Friday, April 5, 2013)]
[Notices]
[Pages 20614-20615]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2013-08024]


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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub.

[[Page 20615]]

L. 89-651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 
301), we invite comments on the question of whether instruments of 
equivalent scientific value, for the purposes for which the instruments 
shown below are intended to be used, are being manufactured in the 
United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before April 25, 2013. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5:00 p.m. at the U.S. Department of 
Commerce in Room 3720.
    Docket Number: 13-007. Applicant: University of Illinois, Materials 
Research Lab, 104 S Goodwin Ave., Urbana, IL 61801. Instrument: 
Electron Microscope. Manufacturer: FEI Company, Czech Republic. 
Intended Use: The instrument will be used to seek the measurement and 
potentially direct-tailoring of materials properties, through the study 
of the relation of structure to catalytic activity, strain and 
composition within nanostructures, the effects of impurities on the 
strength of materials, and other properties of catalytic materials such 
as Pt, Ru, and Mo, semiconductor nanostructures (Si, Ge, InAs), metal 
alloys such as Ni/Al, and other materials. Justification for Duty-Free 
Entry: There are no instruments of the same general category 
manufactured in the United States. Application accepted by Commissioner 
of Customs: February 27, 2013.
    Docket Number: 13-010. Applicant: University of Pittsburgh, 3700 
O'Hara St., 636 Benedum Hall, Pittsburgh, PA 15261. Instrument: 
Electron Microscope. Manufacturer: FEI, Czech Republic. Intended Use: 
The instrument will be used to gain a better understanding of the 
relationship between microstructure and the performance of materials, 
through the analysis of crystallographic texture, the identification of 
crystallographic orientation relationships between precipitates and the 
matrix, precipitate size distributions and the analysis of chemical 
compositions of electronic materials, advanced ceramics for medical 
applications, advanced Ni-based Superalloys, stainless steels (for 
energy applications), advanced high-strength steels, and many other 
materials. Justification for Duty-Free Entry: There are no instruments 
of the same general category manufactured in the United States. 
Application accepted by Commissioner of Customs: March 4, 2013.
    Docket Number: 13-011. Applicant: National Institutes of Health, 
Porter Neurosciences Research Center, 35 Covent Dr., Bethesda, MD 
20892. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. 
Intended Use: The instrument will be used to help understand how the 
human body functions normally, such as in learning, memory or hearing, 
and to understand the pathologies of human diseases. In order to 
understand these functions, this instrument will be used in experiments 
such as identifying the molecular components of a structure in an adult 
and in development, as well as looking for changes in the structure 
brought on by disease or by normal functional changes in cells of 
living organisms such as nerve cells or neurons of the brain, as well 
as inner ear cells. Justification for Duty-Free Entry: There are no 
instruments of the same general category manufactured in the United 
States. Application accepted by Commissioner of Customs: March 8, 2013.

    Dated: March 28, 2013.
Gregory W. Campbell,
Director of Subsidies Enforcement, Import Administration.
[FR Doc. 2013-08024 Filed 4-4-13; 8:45 am]
BILLING CODE 3510-DS-P