[Federal Register Volume 77, Number 235 (Thursday, December 6, 2012)]
[Notices]
[Pages 72826-72827]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2012-29539]


-----------------------------------------------------------------------

DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before December 26, 2012. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5:00 p.m. at the U.S. Department of 
Commerce in Room 3720.
    Docket Number: 12-047. Applicant: Columbia University, 500 West 
20th St., Suite 200, New York, NY 10027. Instrument: Electron 
Microscope. Manufacturer: FEI Co., Czech Republic. Intended Use: The 
instrument will be used to obtain bright-field and dark-field images of 
materials microstructures, to do high resolution lattice imaging, to 
obtain diffraction patterns to identify crystalline phases, to 
determine what elements are in a particular phase using the energy 
dispersive spectrometer, and to obtain atomic number contrast, or Z-
contrast, images using the high angle annular dark field detector. The 
materials to be studied include metal, ceramics, semiconductors, and 
nanostructured materials and nanoparticles. Justification for Duty-Free 
Entry: There are no instruments of the same general category 
manufactured in the United States. Application accepted by Commissioner 
of Customs: October 15, 2012.
    Docket Number: 12-052. Applicant: Stanford University, 450 Sierra 
Mall, Stanford, CA 94305. Instrument: Electron Microscope. 
Manufacturer: FEI Co., the Netherlands. Intended Use: The instrument 
will be used for ``spectrum imaging'' of elemental distributions at the 
sub-nano level, to gather three-dimensional structural information of 
nano-sized crystals as well as to measure electrostatic and magnetic 
fields in a variety of samples. Justification for Duty-Free Entry: 
There are no instruments of the same general category manufactured in 
the United States. Application accepted by Commissioner of Customs: 
November 2, 2012.
    Docket Number: 12-059. Applicant: Stanford University, 450 Sierra 
Mall, Stanford, CA 94305. Instrument: Electron Microscope. 
Manufacturer: FEI Co., the Netherlands. Intended Use: The instrument 
will be used to fabricate plasmonic structures that can trap sub-5-nm 
nanoparticles, create nanoparticles to advance state of the art cancer 
diagnosis, fabricate arrays of micro-Barkhausen Kurz vacuum THz 
oscillators on silicon wafers, develop organic solar cells with higher 
efficiency and organic transistors with higher mobility, create 
nanoscale probes to study the electrical behavior of the heart and 
brain, and attempt to measure persistent currents in topological 
insulators with SQUID magnetometers to confirm the existence of an edge 
state, to test models of the edge state, and to elucidate the 
mechanisms that break the persistent currents. Justification for Duty-
Free Entry: There are no instruments of the same general category 
manufactured in the United States. Application accepted by Commissioner 
of Customs: November 9, 2012.


[[Page 72827]]


    Dated: November 30, 2012.
Gregory W. Campbell,
Director of Subsidies Enforcement, Import Administration.
[FR Doc. 2012-29539 Filed 12-5-12; 8:45 am]
BILLING CODE 3510-DS-P