[Federal Register Volume 77, Number 129 (Thursday, July 5, 2012)]
[Notices]
[Pages 39682-39683]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2012-16462]


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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before July 25, 2012. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5 p.m. at the U.S. Department of 
Commerce in Room 3720.
    Docket Number: 12-025. Applicant: Medical University of South 
Carolina,

[[Page 39683]]

169 Ashley Ave., Charleston, SC 29403. Instrument: Electron Microscope. 
Manufacturer: JEOL, Ltd., Japan. Intended Use: The instrument will be 
used to determine the characteristics and processes involved in 
tumorigenesis and the progression to metastatic disease, by examining 
human and animal tissue to ascertain changes in structure due to 
disease-related phenomenon. The use of electron microscopy provides 
structural assessments that may be coupled with physiological or other 
types of information derived from other techniques to better understand 
the development of disease. Justification for Duty-Free Entry: There 
are no instruments of the same general category manufactured in the 
United States. Application accepted by Commissioner of Customs: June 
11, 2012.
    Docket Number: 12-027. Applicant: University of Wyoming, 1000 E 
University Ave., Laramie, WY 82071. Instrument: Electron Microscope. 
Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument 
will be used to study metals, metal oxides, metal chalcogenides, DNA, 
quantum dots, and carbon nanomaterials to determine their size, shape, 
morphology, composition and crystal structure. Properties such as 
durability, corrosion resistance, crystal growth, and fragmentation 
will be investigated. Justification for Duty-Free Entry: There are no 
instruments of the same general category manufactured in the United 
States. Application accepted by Commissioner of Customs: June 4, 2012.
    Docket Number: 12-028. Applicant: Air Force Institute of 
Technology, 2950 Hobson Way, Wright-Patterson AFB, OH 45433-7765. 
Instrument: Electron Microscope. Manufacturer: FEI Company, Czech 
Republic. Intended Use: The instrument will be used to develop aircraft 
and components with increased reliability, performance, reduction of 
cost, and improved safety, using technology such as thermal shields, 
conductive wires, light-weight structural materials and nano-devices. 
Experiments will involve visual characterization of damaged components, 
experimental components, and reliability investigations on the 
nanometer scale, to identify porosity, fracture surface features, fiber 
damage, crack propagation, as well as the verification of properly 
designed nano-devices and related nanomaterials. Justification for 
Duty-Free Entry: There are no instruments of the same general category 
manufactured in the United States. Application accepted by Commissioner 
of Customs: June 11, 2012.
    Docket Number: 12-031. Applicant: Penn State College of Medicine, 
500 University Dr., Hershey, PA 17033. Instrument: Electron Microscope. 
Manufacturer: JEOL, Ltd., Japan. Intended Use: The instrument will be 
used to further advance the body of research of the College of Medicine 
and the greater scientific community by studying multi-protein 
complexes, DNA protein complexes, small polypeptide biding sites and 
RNA polymerase, among other specimens. The instrument will be used for 
3D image reconstruction from tomograms and single particle data sets 
imaged from vitrified specimens. Justification for Duty-Free Entry: 
There are no instruments of the same general category manufactured in 
the United States. Application accepted by Commissioner of Customs: 
June 13, 2012.

    Dated: June 27, 2012.
Gregory W. Campbell,
Director of Subsidies Enforcement Import Administration.
[FR Doc. 2012-16462 Filed 7-3-12; 8:45 am]
BILLING CODE 3510-DS-P