[Federal Register Volume 77, Number 87 (Friday, May 4, 2012)]
[Notices]
[Pages 26507-26508]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2012-10592]


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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before May 24, 2012. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5:00 p.m. at the U.S. Department of 
Commerce in Room 3720.
    Docket Number: 12-013. Applicant: Washington University in St. 
Louis, 1 Brookings Dr., Saint Louis, MO 63130. Instrument: Electron 
Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: 
The instrument will be used for research on primitive solar system 
materials extracted from meteorites as well as on samples from NASA 
sample return missions, such as STARDUST. The instrument will be used 
for the preparation of TEM thin sections of micron-sized stardust 
grains as well as samples extracted from STARDUST Al foils, to increase 
the understanding of the chemical origin of the solar system and the 
processes by which its small bodies evolved. Justification for Duty-
Free Entry: There are no instruments of the same general category 
manufactured in the United States. Application accepted by Commissioner 
of Customs: March 29, 2012.
    Docket Number: 12-018. Applicant: The Regents of the University of 
California, 1 Cyclotron Rd., MS 46R0125, Berkeley, CA 94720. 
Instrument: Electron Microscope. Manufacturer: FEI Company, Czech 
Republic. Intended Use: The instrument will be used to investigate the 
structure and composition of micro- and nano-materials that will be 
used as light absorbers, catalysts, and membranes in 
photoelectrochemical devices that are engineered to convert solar 
energy to fuel. Justification for Duty-Free Entry: There are no 
instruments of the same general category manufactured in the United 
States. Application accepted by Commissioner of Customs: March 28, 
2012.
    Docket Number: 12-019. Applicant: Schepens Eye Research Institute, 
20 Staniford St., Boston MA, 02114. Instrument: Electron Microscope. 
Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument 
will be used to investigate the genes and proteins that underlie normal 
and pathologic processes associated with human vision, to allow the 
repair, prevention, and cure of sight-threatening pathologies. The 
instrument will be used to examine the ultra structure of biological 
specimens including eye tissues, using conventional observation as well 
as immune-electron microscopy. Justification for Duty-Free Entry: There 
are no instruments of the same general category manufactured in the 
United States. Application accepted by

[[Page 26508]]

Commissioner of Customs: March 28, 2012.
    Docket Number: 12-020. Applicant: Howard Hughes Medical Institute, 
4000 Jones Bridge Rd., Chevy Chase, MD 20815. Instrument: Electron 
Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: 
The instrument will be used to examine the ultrastructural organization 
of biological specimens such as protein complexes, noninfectious virus 
and small cells at high resolution to help elucidate their functions. 
Justification for Duty-Free Entry: There are no instruments of the same 
general category manufactured in the United States. Application 
accepted by Commissioner of Customs: April 6, 2012.
    Docket Number: 12-021. Applicant: Rice University, ECE Department 
MS 378 6100 Main Houston, TX. Instrument: Electron Microscope. 
Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument 
will be used to fabricate, image, and characterize novel metallic 
nanostructures, using high resolution imaging, lithography and electron 
beam assisted gas deposition. The instrument will be used to study the 
plasmonic properties of chemically synthesized nanoparticles and 
lithographically synthesized nanostructures. Justification for Duty-
Free Entry: There are no instruments of the same general category 
manufactured in the United States. Application accepted by Commissioner 
of Customs: April 18, 2012.

     Dated: April 25, 2012.
Gregory W. Campbell,
Director of Subsidies Enforcement, Import Administration.
[FR Doc. 2012-10592 Filed 5-3-12; 8:45 am]
BILLING CODE 3510-DS-M