[Federal Register Volume 77, Number 48 (Monday, March 12, 2012)]
[Notices]
[Page 14504]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2012-5934]


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DEPARTMENT OF COMMERCE

International Trade Administration


Max Planck Florida Institute, et al.; Notice of Consolidated 
Decision on Applications for Duty-Free Entry of Electron Microscope

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR 
part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. 
in Room 3720, U.S. Department of Commerce, 14th and Constitution Avenue 
NW., Washington, DC.
    Docket Number: 11-061. Applicant: Max Planck Florida Institute, 
Jupiter, FL 33458. Instrument: Electron Microscope. Manufacturer: FEI 
Company, Czech Republic. Intended Use: See notice at 77 FR 5767, 
February 6, 2012.
    Docket Number: 11-070. Applicant: University of Utah, Salt Lake 
City, UT 84112. Instrument: Electron Microscope. Manufacturer: FEI 
Company, Czech Republic. Intended Use: See notice at 77 FR 5767, 
February 6, 2012.
    Docket Number: 11-071. Applicant: Texas Tech University, Lubbock, 
TX 79409-3103. Instrument: Electron Microscope. Manufacturer: Hitachi 
High-Technologies Corporation, Japan. Intended Use: See notice at 77 FR 
5767, February 6, 2012.
    Docket Number: 11-073. Applicant: Ball State University, Muncie, IN 
47306. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. 
Intended Use: See notice at 77 FR 5767, February 6, 2012.
    Docket Number: 11-075. Applicant: Cleveland State University, 
Cleveland, OH 44115-2214. Instrument: Electron Microscope. 
Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 
77 FR 5767, February 6, 2012.
    Docket Number: 12-003. Applicant: University of California, Irvine, 
Irvine, CA 92697. Instrument: Electron Microscope. Manufacturer: FEI 
Company, Czech Republic. Intended Use: See notice at 77 FR 5767, 
February 6, 2012.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as this instrument is intended to be used, is being 
manufactured in the United States at the time the instrument was 
ordered. Reasons: Each foreign instrument is an electron microscope and 
is intended for research or scientific educational uses requiring an 
electron microscope. We know of no electron microscope, or any other 
instrument suited to these purposes, which was being manufactured in 
the United States at the time of order of each instrument.

     Dated: March 5, 2012.
Gregory W. Campbell,
Director, Subsidies Enforcement Office, Import Administration.
[FR Doc. 2012-5934 Filed 3-9-12; 8:45 am]
BILLING CODE 3510-DS-P