[Federal Register Volume 77, Number 24 (Monday, February 6, 2012)]
[Notices]
[Pages 5767-5768]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2012-2623]


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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent

[[Page 5768]]

scientific value, for the purposes for which the instruments shown 
below are intended to be used, are being manufactured in the United 
States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before February 27, 2012. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5:00 p.m. at the U.S. Department of 
Commerce in Room 3720.
    Docket Number: 11-061. Applicant: Max Planck Florida Institute, 
5353 Parkside Dr., MC19-RE Jupiter, FL 33458. Instrument: Electron 
Microscope. Manufacturer: FEI Co., Czech Republic. Intended Use: The 
instrument will be used to construct a digital anatomical atlas of the 
brain, involving refining the provisional localization of different 
calcium channel subunits from fluorescence microscopy initially by 
super resolution STED and then by immunogold freeze-fracture replica 
labeling. The objectives of the research also include understanding 
visual perception and the organization of the visual cortex, synapse 
physiology and mechanisms of synaptic signaling and computation, the 
molecular mechanism of synaptic function, the cellular organization of 
cortical circuit function, and the digital anatomy of the brain. 
Observations made by light microscopy may be required to be 
corroborated by electron microscopy in order to be accepted for 
publication. A unique feature of this instrument is the multi-specimen 
holder that can be tilted more than 45 degrees, which is necessary to 
observe irregular surfaces of specimens three dimensionally. 
Justification for Duty-Free Entry: There are no instruments of the same 
general category manufactured in the United States. Application 
accepted by Commissioner of Customs: October 19, 2011.
    Docket Number: 11-070. Applicant: University of Utah, 201 
Presidents Circle, Room 201, Salt Lake City, UT 84112. Instrument: 
Electron Microscope. Manufacturer: FEI Company, Czech Republic. 
Intended Use: The instrument will be used to study semiconductor 
materials and devices, nanophotonic devices, photovoltaic materials, as 
well as geologic and biological materials. The objectives of the 
experiments include high contrast, low voltage imaging of beam-
sensitive materials at magnifications greater than 100,000X. 
Justification for Duty-Free Entry: There are no instruments of the same 
general category manufactured in the United States. Application 
accepted by Commissioner of Customs: November 28, 2011.
    Docket Number: 11-071. Applicant: Texas Tech University, 100 
Engineering Center, 9th and Canton, Lubbock, TX 79409-3103. Instrument: 
Electron Microscope. Manufacturer: Hitachi High-Technologies 
Corporation, Japan. Intended Use: The instrument will be used to 
correlate the structural properties with observed physical properties 
such as magnetic and electronic properties of a variety of materials, 
from inorganic to organic, which exhibit features which can only be 
observed with this type of microscope. The research will involve 
temperature dependence imaging and energy dispersive x-ray analysis. 
The data collected will be applied to energy storage and conversion, 
environmental remediation and catalysis. Justification for Duty-Free 
Entry: There are no instruments of the same general category 
manufactured in the United States. Application accepted by Commissioner 
of Customs: December 9, 2011.
    Docket Number: 11-073. Applicant: Ball State University, 2000 W 
University Ave., Muncie, Indiana 47306. Instrument: Electron 
Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: The 
instrument will be used to study the developing nervous system, 
chemical stressors in freshwater ecosystems, organ development, cells 
that line blood vessel walls, luminescent thin films, carbon nanotube 
synthesis, and air purification materials. Tissues that will be 
examined will include brain, heart, lung, muscle, and cultured cells. 
Material samples include thin film, nanoparticles and nanotubes. The 
main objective of the research is to obtain images that the existing 
technology cannot currently resolve, including resolution at the 
nanometer level and below. Justification for Duty-Free Entry: There are 
no instruments of the same general category manufactured in the United 
States. Application accepted by Commissioner of Customs: January 6, 
2012.
    Docket Number: 11-075. Applicant: Cleveland State University, 2121 
Euclid Ave., Cleveland, OH 44115-2214. Instrument: Electron Microscope. 
Manufacturer: FEI Co., Czech Republic. Intended Use: The instrument 
will be used to study superstructures formed by semiconductor and metal 
nanoparticles. The experiments will include fabrication of self-
assembled structures using a hybrid nanofabrication approach, obtaining 
high resolution imaging of the structures, and optical characterization 
using high resolution spectroscopy. Justification for Duty-Free Entry: 
There are no instruments of the same general category manufactured in 
the United States. Application accepted by Commissioner of Customs: 
January 5, 2012.
    Docket Number: 12-003. Applicant: University of California, Irvine, 
4100 Calit2 building, Irvine, CA 92697. Instrument: Electron 
Microscope. Manufacturer: FEI Co., Czech Republic. Intended Use: The 
instrument will be used to perform experiments involving imaging and 
elemental composition determination of semiconductors, metals, 
ceramics, polymers, etc. Justification for Duty-Free Entry: There are 
no instruments of the same general category manufactured in the United 
States. Application accepted by Commissioner of Customs: January 23, 
2012.

    Dated: January 31, 2012.
Gregory Campbell,
Director, IA Subsidies Enforcement Office.
[FR Doc. 2012-2623 Filed 2-3-12; 8:45 am]
BILLING CODE 3510-DS-P