[Federal Register Volume 76, Number 193 (Wednesday, October 5, 2011)]
[Notices]
[Pages 61668-61669]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2011-25737]


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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before October 25, 2011. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5 p.m. at the U.S. Department of 
Commerce in Room 3720.

    Docket Number: 11-059. Applicant: University of Arkansas Office of 
Business Affairs, ADMN 321, 1 University of Arkansas, Favetteville, AR 
72701-1201. Instrument: Electron Microscope. Manufacturer: JEOL, Ltd., 
Japan. Intended Use: The instrument will be used to study semiconductor 
materials, metals, ceramics, and biological tissues, to determine the 
influence of impurities on medicine efficiency, the kinetics of the 
growth of particles in a specific environment, the phase transformation 
of metals, and the study of other phenomena. Justification for Duty-
Free Entry: There are no instruments of the same general category 
manufactured in the United States. Application accepted by Commissioner 
of Customs: September 15, 2011.

    Docket Number: 11-062. Applicant: University of Buffalo, NYS Center 
for Excellence, 701 Ellicott St., HJKRI B4-321, Buffalo, NY 14203. 
Instrument: Electron Microscope. Manufacturer: FEI, Czech Republic. 
Intended Use: The instrument will be used to study the normal and 
pathological brains and peripheral nerves from animal models, assessing 
the degree and quality of myelination and neuronal differentiation 
under different experimental conditions. The objective of the 
experiments is to discover treatments and cures for Krabbe and other 
demyelinating disease. The experiments require 2-angstrom resolution in 
order to examine the specimens. Justification for Duty-Free Entry: 
There are no instruments of the

[[Page 61669]]

same general category manufactured in the United States. Application 
accepted by Commissioner of Customs: September 7, 2011.

    Docket Number: 11-063. Applicant: Mount Sinai School of Medicine, 1 
Gustave L. Levy Place New York, NY 10029-6574. Instrument: Electron 
Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: The 
instrument will be used to image a wide range of biological assemblies 
composed of protein, nucleic acids, lipid and detergent. The studies 
will include structural studies of nucleic acid binding protein, 
viruses and membrane proteins, among other research. A 120kV electron 
microscope with an anticontaminator and specimen holder suitable for 
imaging biological samples at liquid nitrogen temperatures is required 
for the research. Justification for Duty-Free Entry: There are no 
instruments of the same general category manufactured in the United 
States. Application accepted by Commissioner of Customs: September 16 
2011.

    Docket Number: 11-064. Applicant: University of Wyoming, 1000 E 
University Ave., Laramie, WY 82071. Instrument: Electron Microscope. 
Manufacturer: FEI, Czech Republic. Intended Use: The instrument will be 
used to study solar energy and materials science research. There are no 
other instruments with the necessary resolution that are also capable 
of operation at very high pressures (chamber pressures approaching 
atmospheric pressures), which are essential for the research 
applications. There are also no microscopes manufactured in the United 
States that are capable of spatial resolution on the nanometer scale, 
and generation and analysis of electron-beam induced signals such as 
characteristic x-ray analysis, electron beam induced current 
measurements, and e-beam lithography. Justification for Duty-Free 
Entry: There are no instruments of the same general category 
manufactured in the United States. Application accepted by Commissioner 
of Customs: September 16, 2011.

    Dated: September 29, 2011.
Gregory Campbell,
Director, IA Subsidies Enforcement Office.
[FR Doc. 2011-25737 Filed 10-4-11; 8:45 am]
BILLING CODE 3510-DS-P