[Federal Register Volume 76, Number 176 (Monday, September 12, 2011)]
[Notices]
[Page 56157]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2011-23277]


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DEPARTMENT OF COMMERCE

International Trade Administration


Brandeis University, et al.; Notice of Consolidated Decision on 
Applications for Duty-Free Entry of Electron Microscope

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR 
part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. 
in Room 3720, U.S. Department of Commerce, 14th and Constitution 
Avenue, NW., Washington, DC.
    Docket Number: 11-042. Applicant: Brandeis University, Waltham, MA 
02454. Instrument: Technai G2 F20 Twin Electron Microscope. 
Manufacturer: FEI Company, the Netherlands. Intended Use: See notice at 
76 FR 48803, August 9, 2011.
    Docket Number: 11-043. Applicant: Mississippi State University, 
Pearl, MS 39208. Instrument: Transmission Electron Microscope. 
Manufacturer: JEOL, Ltd., Japan. Intended Use: See notice at 76 FR 
47148, August 4, 2011.
    Docket Number: 11-049. Applicant: University of Missouri, Columbia, 
MO 65211. Instrument: Electron Microscope. Manufacturer: FEI Company, 
Czech Republic. Intended Use: See notice at 76 FR 48803, August 9, 
2011.
    Docket Number: 11-051. Applicant: DOD Uniformed Services University 
of the Health Sciences, Bethesda, MD 20814-4799. Instrument: 
Transmission Electron Microscope. Manufacturer: JEOL, Ltd., Japan. 
Intended Use: See notice at 76 FR 48803, August 9, 2011.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as this instrument is intended to be used, is being 
manufactured in the United States at the time the instrument was 
ordered. Reasons: Each foreign instrument is an electron microscope and 
is intended for research or scientific educational uses requiring an 
electron microscope. We know of no electron microscope, or any other 
instrument suited to these purposes, which was being manufactured in 
the United States at the time of order of each instrument.

    Dated: September 2, 2011.
Gregory W. Campbell,
Director, Subsidies Enforcement Office, Import Administration.
[FR Doc. 2011-23277 Filed 9-9-11; 8:45 am]
BILLING CODE 3510-DS-P