[Federal Register Volume 76, Number 176 (Monday, September 12, 2011)]
[Notices]
[Page 56156]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2011-23256]


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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before October 3, 2011. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5 p.m. at the U.S. Department of 
Commerce in Room 3720.
    Docket Number: 11-056. Applicant: Battelle Energy Alliance, 2525 
North Freemont Ave., Idaho Falls, ID 83415. Instrument: Electron 
Microscope. Manufacturer: FEI Company, the Netherlands. Intended Use: 
The instrument will be used to analyze nuclear fuels and materials for 
energy production. The experiments will involve structural and chemical 
analyses of materials on the atomic resolution scale. Current U.S. 
manufactured instruments do not reach the sensitivity level of this 
instrument. Justification for Duty-Free Entry: There are no instruments 
of the same general category manufactured in the United States. 
Application accepted by Commissioner of Customs: August 16, 2011.
    Docket Number: 11-057. Applicant: Battelle Energy Alliance, 2525 
North Freemont Ave., Idaho Falls, ID 83415. Instrument: Electron 
Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: 
The instrument will be used to analyze nuclear fuels and materials for 
energy production. The experiments will involve structural and chemical 
analyses of materials on the electron based nanometer scale. Current 
U.S. manufactured instruments do not reach the sensitivity level of 
this instrument. Justification for Duty-Free Entry: There are no 
instruments of the same general category manufactured in the United 
States. Application accepted by Commissioner of Customs: August 15, 
2011.
    Docket Number: 11-058. Applicant: University of Texas at Austin, 
Texas Materials Institute, 1 University Station C2201, Austin, TX 
78712. Instrument: Electron Microscope. Manufacturer: FEI Company, the 
Netherlands. Intended Use: The instrument will be used to study 
materials such as polymers, metals, ceramics, and biological specimens 
like tissues, viruses, and bacteria, to determine the morphology of 
multiphase materials, determine the particle size and size 
distribution, probe the sample's surface topography, and determine the 
chemical composition of materials at nanometer scale. Scanning electron 
microscopy is the only technique that allows direct imaging of material 
features within the nanometer size range. Justification for Duty-Free 
Entry: There are no instruments of the same general category 
manufactured in the United States. Application accepted by Commissioner 
of Customs: August 9, 2011.

    Dated: September 2, 2011.
Gregory Campbell,
Director, IA Subsidies Enforcement Office.
[FR Doc. 2011-23256 Filed 9-9-11; 8:45 am]
BILLING CODE 3510-DS-P