[Federal Register Volume 76, Number 159 (Wednesday, August 17, 2011)]
[Notices]
[Pages 50997-50998]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2011-21005]


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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before September 6, 2011. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5 p.m. at the U.S. Department of 
Commerce in Room 3720.
    Docket Number: 11-047. Applicant: Ohio State University, School of 
Earth Sciences, 275 Mendenhall Laboratory, 125 South Oval Mall, 
Columbus, OH 43210. Instrument: Electron Microscope. Manufacturer: FEI 
Company, Czech Republic. Intended Use: Several characteristics of the 
instrument which are required for the research include an

[[Page 50998]]

automated mineralogy analyzer for analysis and interpretation of major 
and trace chemistry, mineral phase matching with rapidly-acquired 
energy dispersive x-ray data, the ability to have comprehensive offline 
image analysis and x-ray spectral analysis as well as variable vacuum 
modes to allow observation of uncoated nonconductive specimens. 
Justification for Duty-Free Entry: There are no instruments of the same 
general category manufactured in the United States. Application 
accepted by Commissioner of Customs: July 27, 2011.
    Docket Number: 11-050. Applicant: Southwest Research Institute, 
6220 Culebra Rd., San Antonio, TX 78239-5166. Instrument: Electron 
Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: 
The instrument will be used to study bones and other biological 
materials to characterize structural features responsible for reduced 
fracture strength in osteoporosis and studying the performance of bone 
scaffolds for enhancing re-growth of bone into damaged areas. This 
instrument has the ability to characterize biological samples at water 
vapor pressures up to 2,600 Pa, assuring that artifacts will not 
obscure the actual examination of the actual structure and composition, 
which is required for the research. The technical specifications for 
the SEMs manufactured in the United States by TESCAN listed at 
tescan.com indicated that their SEMs had a maximum vapor pressure of 
150 Pa, which is well below the level at which moisture will evaporate 
from biological samples. Justification for Duty-Free Entry: There are 
no instruments of the same general category manufactured in the United 
States. Application accepted by Commissioner of Customs: July 27, 2011.
    Docket Number: 11-052. Applicant: Southern University and A&M 
College, 4th Floor, J.S. Clark Building, Baton Rouge, LA 70813. 
Instrument: Electron Microscope. Manufacturer: JEOL, Japan. Intended 
Use: Among others, the research topics include the investigation of the 
self-healing of structural damage using shape memory polymer based 
composites, and the study of electronic based chemical sensors. The 
instrument will provide high-resolution capabilities. Justification for 
Duty-Free Entry: There are no instruments of the same general category 
manufactured in the United States. Application accepted by Commissioner 
of Customs: August 1, 2011.
    Docket Number: 11-053. Applicant: University of Texas Health 
Science Center--Houston, 6431 Fannin, Houston, TX 77030. Instrument: 
Electron Microscope. Manufacturer: JEOL, Japan. Intended Use: The 
instrument will be used to examine immune-gold labeled biological 
specimens and capture high resolution digital images to determine 
whether proteins are spatial segregated on the plasma membrane of 
mammalian cells. The instrument must be capable of providing high-
resolution and high-contrast images, a stage that is easy to move, a 
focus that does not change with changing magnification, and brightness 
that changes automatically with magnification. Justification for Duty-
Free Entry: There are no instruments of the same general category 
manufactured in the United States. Application accepted by Commissioner 
of Customs: July 29, 2011.
    Docket Number: 11-054. Applicant: Battelle Energy Alliance, Idaho 
National Laboratory, 2525 North Freemont Ave., Idaho Falls, ID 83415. 
Instrument: Electron Microscope. Manufacturer: FEI Company, Czech 
Republic. Intended Use: The instrument will be used to analyze nuclear 
fuels and materials to make determinations of and produce materials 
that have improved performance in advanced reactor systems. Current 
U.S. manufactured instruments do not reach the sensitivity level of 
this instrument. Justification for Duty-Free Entry: There are no 
instruments of the same general category manufactured in the United 
States. Application accepted by Commissioner of Customs: August 3, 
2011.
    Docket Number: 11-055. Applicant: University of Washington, 1959 NE 
Pacific St., Seattle, WA 98195. Instrument: Electron Microscope. 
Manufacturer: FEI Company, the Netherlands. Intended Use: The 
instrument will be used to study proteins, macromolecular complexes, 
viruses, and nanostructured materials to obtain structural information 
of biological specimens at the highest achievable resolution. 
Justification for Duty-Free Entry: There are no instruments of the same 
general category manufactured in the United States. Application 
accepted by Commissioner of Customs: August 3, 2011.

    Dated: August 11, 2011.
Gregory W. Campbell,
Director, IA Subsidies Enforcement Office.
[FR Doc. 2011-21005 Filed 8-16-11; 8:45 am]
BILLING CODE 3510-DS-P