[Federal Register Volume 76, Number 128 (Tuesday, July 5, 2011)]
[Notices]
[Pages 39070-39071]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2011-16754]


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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we

[[Page 39071]]

invite comments on the question of whether instruments of equivalent 
scientific value, for the purposes for which the instruments shown 
below are intended to be used, are being manufactured in the United 
States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before July 25, 2011. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5 p.m. at the U.S. Department of 
Commerce in Room 3720.
    Docket Number: 11-032. Applicant: Southern Illinois University, 
Integrated Microscopy and Graphic Expertise (IMAGE) Center, 750 
Communications Drive--Mailcode 4402, Carbondale, IL 62901. Instrument: 
Quanta 450 scanning electron microscope. Manufacturer: FEI Company, 
Czech Republic. Intended Use: The instrument will be used to study 
nanowires, nanocatalysts, nanotubes, nanolubricants, geological 
specimens, synthetic hip joints, and cellulose (wood chips), for their 
molecular components and properties. Justification for Duty-Free Entry: 
No instruments of the same general category, or instruments otherwise 
applicable for the intended purpose, are being manufactured in the 
United States. Application accepted by Commissioner of Customs: June 
10, 2011.
    Docket Number: 11-037. Applicant: Tulane University, 6823 St. 
Charles Avenue, New Orleans, LA 70118. Instrument: Field-emission 
transmission electron microscope. Manufacturer: FEI Company, the 
Netherlands. Intended Use: The instrument will enhance the research 
resources available to new faculty across a range of scientific and 
engineering disciplines doing a variety of research projects involving 
organic and inorganic materials at the nano, molecular and cellular 
levels. Justification for Duty-Free Entry: No instruments manufactured 
in the United States can meet the high-resolution, cryo-enabled and 
field-emission technical requirements for the intended uses. 
Application accepted by Commissioner of Customs: June 16, 2011.
    Docket Number: 11-038. Applicant: Battelle Memorial Institute, 
Pacific Northwest National Laboratory, 3335 Q Avenue, Richland, WA 
99354. Instrument: Scanning transmission electron microscope. 
Manufacturer: FEI Company, the Netherlands. Intended Use: The 
instrument will replace an old existing transmission electron 
microscope to meet the current technical requirements for research and 
study relating to geochemistry, nanostructured and energy-related 
materials, catalysis imaging, and structural and chemical composition. 
Justification for Duty-Free Entry: No instruments of the same general 
category, or instruments otherwise applicable for the intended purpose, 
are being manufactured in the United States. Application accepted by 
Commissioner of Customs: June 15, 2011.

    Dated: June 28, 2011.
Gregory W. Campbell,
Director, Subsidies Enforcement Office, Office of Policy, Import 
Administration.
[FR Doc. 2011-16754 Filed 7-1-11; 8:45 am]
BILLING CODE 3510-DS-P