[Federal Register Volume 76, Number 60 (Tuesday, March 29, 2011)]
[Notices]
[Page 17381]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2011-7226]


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DEPARTMENT OF COMMERCE

International Trade Administration


Battelle Memorial Institute, et al.; Notice of Consolidated 
Decision on Applications for Duty-Free Entry of Electron Microscopes

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR 
part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. 
in Room 3720, U.S. Department of Commerce, 14th and Constitution 
Avenue., NW., Washington, DC.
    Docket Number: 10-045. Applicant: Battelle Memorial Institute, 
Richland, WA 99354. Instrument: Electron Microscope. Manufacturer: FEI 
Company, the Netherlands. Intended Use: See notice at 76 FR 11199, 
March 1, 2011.
    Docket Number: 10-072. Applicant: University of Puerto Rico, San 
Juan, PR 00936-5067. Instrument: Electron Microscope. Manufacturer: 
JEOL, Ltd., Japan. Intended Use: See notice at 76 FR 11199, March 1, 
2011.
    Docket Number: 10-076. Applicant: Regents of the University of 
Minnesota, Minneapolis, MN 55455. Instrument: Electron Microscope. 
Manufacturer: FEI Inc., Czech Republic. Intended Use: See notice at 76 
FR 11199, March 1, 2011.
    Docket Number: 11-002. Applicant: Weill Cornell Medical College of 
Cornell University, New York, NY 10065. Instrument: Electron 
Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 
76 FR 11199, March 1, 2011.
    Docket Number: 11-003. Applicant: Armed Forces Institute of 
Pathology, Washington, DC 20306-6000. Instrument: Electron Microscope. 
Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 76 FR 
11199, March 1, 2011.
    Docket Number: 11-004. Applicant: San Diego State University, San 
Diego, CA 92182. Instrument: Electron Microscope. Manufacturer: FEI 
Inc., Czech Republic. Intended Use: See notice at 76 FR 11199, March 1, 
2011.
    Docket Number: 11-005. Applicant: National Institute of Standards 
and Technology, Boulder, CO 80305-3328. Instrument: Electron 
Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 
76 FR 11199, March 1, 2011.
    Docket Number: 11-006. Applicant: University of Vermont, 
Colchester, VT 65446. Instrument: Electron Microscope. Manufacturer: 
JEOL Ltd., Japan. Intended Use: See notice at 76 FR 11199, March 1, 
2011.
    Docket Number: 11-007. Applicant: University of Arkansas, 
Fayetteville, AR 72701. Instrument: Electron Microscope. Manufacturer: 
FEI Inc., the Netherlands. Intended Use: See notice at 76 FR 11199, 
March 1, 2011.
    Docket Number: 11-015. Applicant: The Regents of the University of 
California, Berkeley, CA 94720. Instrument: Electron Microscope. 
Manufacturer: Carl Zeiss SMT, Inc., Germany. Intended Use: See notice 
at 76 FR 11199, March 1, 2011.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as these instruments are intended to be used, was being 
manufactured in the United States at the time the instruments were 
ordered. Reasons: Each foreign instrument is an electron microscope and 
is intended for research or scientific educational uses requiring an 
electron microscope. We know of no electron microscope, or any other 
instrument suited to these purposes, which was being manufactured in 
the United States at the time of order of each instrument.

    Dated: March 22, 2011.
Gregory W. Campbell,
Director, Subsidies Enforcement Office, Import Administration.
[FR Doc. 2011-7226 Filed 3-28-11; 8:45 am]
BILLING CODE 3510-DS-P