[Federal Register Volume 75, Number 197 (Wednesday, October 13, 2010)]
[Notices]
[Pages 62763-62764]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2010-25775]


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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before November 2, 2010. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5 p.m. at the U.S. Department of 
Commerce in Room 3720.
    Docket Number: 10-061. Applicant: Georgia Institute of Technology, 
771 Ferst Drive, NW., School of Materials Science and Engineering, 
Atlanta, GA 30332-0245. Instrument: Electron Microscope. Manufacturer: 
FEI

[[Page 62764]]

Company, the Netherlands. Intended Use: The instrument will be used to 
examine the crystalline structures of strain-tunable quantum dots, 
mapping valence states of transition-metal elements, and other 
experiments. The high-resolution as well as the analytical components 
of the instrument are necessary to elicit information from core-shell 
nanoparticles. Justification for Duty-Free Entry: There are no 
instruments of the same general category manufactured in the United 
States. Application accepted by Commissioner of Customs: September 22, 
2010.
    Docket Number: 10-062. Applicant: Washington State University, 220 
French Administration Building, P.O. Box 641020, Pullman, WA 99164-
1020. Instrument: Electron Microscope. Manufacturer: FEI Company, Czech 
Republic. Intended Use: The instrument will be used to study materials 
in the nanometer range such as catalyzer, tissues, and cells. This 
instrument will be used for high resolution analysis of cell internal 
structures. Justification for Duty-Free Entry: There are no instruments 
of the same general category manufactured in the United States. 
Application accepted by Commissioner of Customs: September 16, 2010.
    Docket Number: 10-063. Applicant: National Institutes of Health, 50 
South Dr., Bldg. 50, Rm. 1517, Bethesda, MD 20892-8025. Instrument: 
Electron Microscope. Manufacturer: JEOL Limited, Japan. Intended Use: 
The instrument will be used to study viruses using cryo-electron 
tomography. Interpretability of the tomograms will be greatly enhanced 
by extending the resolution using phase-plate technology with this 
instrument. The instrument is also uniquely capable of single-particle 
analyses. Justification for Duty-Free Entry: There are no instruments 
of the same general category manufactured in the United States. 
Application accepted by Commissioner of Customs: September 22, 2010.

    Dated: October 6, 2010.
Gregory W. Campbell,
Acting Director, IA Subsidies Enforcement Office.
[FR Doc. 2010-25775 Filed 10-12-10; 8:45 am]
BILLING CODE 3510-DS-P