[Federal Register Volume 75, Number 143 (Tuesday, July 27, 2010)]
[Notices]
[Page 43918]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2010-18390]


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DEPARTMENT OF COMMERCE

International Trade Administration


National Center for Toxicological Research, et al.; Notice of 
Consolidated Decision on Applications for Duty-Free Entry of Electron 
Microscopes

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR 
part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. 
in Room 3720, U.S. Department of Commerce, 14th and Constitution 
Avenue, NW., Washington, DC.
    Docket Number: 10-015. Applicant: National Center for Toxicological 
Research, (USFDA), Jefferson, AK 72079. Instrument: Electron 
Microscope. Manufacturer: JEOL, Ltd., Japan. Intended Use: See notice 
at 75 FR 37384, June 29, 2010.
    Docket Number: 10-023. Applicant: University of Virginia, 
Charlottesville, VA 22903. Instrument: Electron Microscope. 
Manufacturer: FEI Company, the Netherlands. Intended Use: See notice at 
75 FR 37384, June 29, 2010.
    Docket Number: 10-029. Applicant: Argonne National Laboratory, 
Lemont, IL 60439. Instrument: Electron Microscope. Manufacturer: JEOL, 
Ltd., Japan. Intended Use: See notice at 75 FR 37384, June 29, 2010.
    Docket Number: 10-030. Applicant: University of California, Davis, 
CA 95616. Instrument: Electron Microscope. Manufacturer: Elionix Co., 
Ltd., Japan. Intended Use: See notice at 75 FR 37384, June 29, 2010.
    Docket Number: 10-031. Applicant: National Institutes of Health, 
Bethesda, MD 20892. Instrument: Electron Microscope. Manufacturer: 
JEOL, Ltd., Japan. Intended Use: See notice at 75 FR 37384, June 29, 
2010.
    Docket Number: 10-032. Applicant: Battelle Memorial Institute, 
Richland, WA 99354. Instrument: Electron Microscope. Manufacturer: FEI 
Company, the Netherlands. Intended Use: See notice at 75 FR 37384, June 
29, 2010.
    Docket Number: 10-033. Applicant: Massachusetts General Hospital, 
Charlestown, MA 02120. Instrument: Electron Microscope. Manufacturer: 
JEOL Ltd., Japan. Intended Use: See notice at 75 FR 37384, June 29, 
2010.
    Docket Number: 10-035. Applicant: University of Maine System, St., 
Bangor, ME 04401. Instrument: Electron Microscope. Manufacturer: 
Tescan, Czech Republic. Intended Use: See notice at 75 FR 37384, June 
29, 2010.
    Docket Number: 10-036. Applicant: University of Kansas Medical 
Center, Kansas City, KS 66160. Instrument: Electron Microscope. 
Manufacturer: JEOL, Ltd., Japan. Intended Use: See notice at 75 FR 
37384, June 29, 2010.
    Docket Number: 10-037. Applicant: University of South Dakota, 
Vermillion, SD 57069. Instrument: Electron Microscope. Manufacturer: 
FEI Company, Czech Republic. Intended Use: See notice at 75 FR 37384, 
June 29, 2010.
    Docket Number: 10-040. Applicant: Illinois State University, 
Normal, IL 61790-4120. Instrument: Electron Microscope. Manufacturer: 
FEI Company, Czech Republic. Intended Use: See notice at 75 FR 37384, 
June 29, 2010.
    Docket Number: 10-041. Applicant: Temple University, Philadelphia, 
PA 19122. Instrument: Electron Microscope. Manufacturer: JEOL, Ltd., 
Japan. Intended Use: See notice at 75 FR 37384, June 29, 2010.
    Docket Number: 10-042. Applicant: University of Arkansas for 
Medical Sciences, Little Rock, AR 72205. Instrument: Electron 
Microscope. Manufacturer: FEI, the Netherlands. Intended Use: See 
notice at 75 FR 37384, June 29, 2010.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as these instruments are intended to be used, was being 
manufactured in the United States at the time the instruments were 
ordered. Reasons: Each foreign instrument is an electron microscope and 
is intended for research or scientific educational uses requiring an 
electron microscope. We know of no electron microscope, or any other 
instrument suited to these purposes, which was being manufactured in 
the United States at the time of order of each instrument.

    Dated: July 21, 2010.
Christopher Cassel,
Director, Subsidies Enforcement Office, Import Administration.
[FR Doc. 2010-18390 Filed 7-26-10; 8:45 am]
BILLING CODE 3510-DS-P