[Federal Register Volume 75, Number 54 (Monday, March 22, 2010)]
[Notices]
[Page 13486]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2010-6255]


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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before April 12, 2010. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce, Washington, D.C. 20230. Applications may be 
examined between 8:30 A.M. and 5:00 P.M. at the U.S. Department of 
Commerce in Room 3720.
    Docket Number: 10-004. Applicant: State University of New York 
College at Geneseo, Erwin Hall 218, 1 College Circle, Geneseo, NY 
14454. Instrument: MultiView 2000TS Microscope System. Manufacturer: 
Nanonics Imaging Ltd., Israel. Intended Use: This instrument will be 
used, among other things, to study the folding structure of A-beta 
proteins around nanostructures. This instrument combines an optical 
microscope with a scanning probe imaging system. Specifically, this 
instrument can perform near-field scanning optical microscopy. A 
pertinent feature of this instrument is the ability to switch between 
scanning the tip and the sample stage. It is also well suited for soft 
materials than other instruments, as it detects the probe coming close 
to the sample surface by monitoring a frequency shift in a nano-tuning 
fork. Other unique features include the ability to use conventional AFM 
type silicon cantilevers as well as cantilevered optical fiber probes 
with exposed probe geometry, providing normal force sensing; the 
capability to image side walls with an exposed tip glass AFM probe and 
the ability to image in both NSOM and AFM with AC operating modes. 
Justification for Duty-Free Entry: No instruments of same general 
category are believed to be manufactured in the United States. 
Application accepted by Commissioner of Customs: March 10, 2010.

    Dated: March 16, 2010.
Christopher Cassel,
Director, IA Subsidies Enforcement Office.
[FR Doc. 2010-6255 Filed 3-19-10; 8:45 am]
BILLING CODE 3510-DS-S