[Federal Register Volume 75, Number 49 (Monday, March 15, 2010)]
[Notices]
[Page 12175]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2010-5594]


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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before April 5, 2010. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5 p.m. at the U.S. Department of 
Commerce in Room 3720.
    Docket Number: 10-001. Applicant: United States Environmental 
Protection Agency, 26 W. MLK Ave., ML 681, Cincinnati, OH 45268. 
Instrument: Electron Microscope. Manufacturer: JEOL, Japan. Intended 
Use: The instrument will be used to investigate material and 
biological, micro and nano-sized phenomena from a variety of sources. 
The samples will be fixed, sectioned and attached to grids to be viewed 
in the instrument. Justification for Duty-Free Entry: There are no 
domestic manufacturers of this instrument. Application accepted by 
Commissioner of Customs: January 29, 2010.

    Dated: March 9, 2010.
Christopher Cassel,
Director, IA Subsidies Enforcement Office.
[FR Doc. 2010-5594 Filed 3-12-10; 8:45 am]
BILLING CODE 3510-DS-P