[Federal Register Volume 75, Number 15 (Monday, January 25, 2010)]
[Notices]
[Page 3895]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2010-1337]



[[Page 3895]]

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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before February 16, 2010. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5 p.m. at the U.S. Department of 
Commerce in Room 3720.
    Docket Number: 09-068. Applicant: University of Arkansas, 321 
Administration Building, Fayetteville, Arkansas 72701.
    Instrument: Fluorescence Lifetime Imaging Microscope.
    Manufacturer: PicoQuant Photonics, Germany. Intended Use: The 
instrument will be used to measure both fluorescence lifetime and 
fluorescence intensity of single nanoparticles and biomolecules. The 
instrument must be able to perform using lasers with both continuous 
wave (CW) and pulsed mode. The use of picoseconds pulsed lasers is 
necessary to measure fluorescence lifetime. The use of CW lasers, so 
that the fluorophores will be continuously excited, is necessary to 
measure fluorescence intensity. The driver that controls the laser head 
provides user-selectable pulsed repetition rates. This instrument is 
unique in that it is capable of pulsed interleaved excitation (PIE)--
Fluorescence Resonance Energy Transfer (FRET) and of allowing 
repetition rates to be continuously varied down to the 200 kHz range. 
Furthermore, the instrument is compatible with atomic force microscopy 
by using objective scanning mode rather than sample scanning mode so 
that the sample-scanning Atomic Force Microscope (AFM) can be added to 
the microscope in a future upgrade.
    Justification for Duty-Free Entry: No instruments of same general 
category are manufactured in the United States.
    Application accepted by Commissioner of Customs: December 28, 2009.

    Dated January 19, 2010.
Christopher Cassel,
Director, IA Subsidies Enforcement Office.
[FR Doc. 2010-1337 Filed 1-22-10; 8:45 am]
BILLING CODE 3510-DS-P