[Federal Register Volume 74, Number 243 (Monday, December 21, 2009)]
[Notices]
[Page 67851]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: E9-30322]



[[Page 67851]]

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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before January 11, 2010. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5 p.m. at the U.S. Department of 
Commerce in Room 3720.
    Docket Number: 09-064. Applicant: Yale University, 15 Prospect St., 
P.O. Box 208284, New Haven, CT 06520-8284. Instrument: Electron 
Microscope, Quanta 3D Dual-Beam Focused Ion-Beam Tool. Manufacturer: 
FEI Company, Czech Republic. Intended Use: The instrument will be used 
to study the physics and engineering of small structures, including the 
crystal structure of alumina. The instrument will be used for cutting 
precise cross-sections of materials and devices using a focused beam of 
gallium ions. The instrument is also equipped with a scanning electron 
microscope for the non-destructive viewing of samples. Justification 
for Duty-Free Entry: No instruments of same general category are 
manufactured in the United States. Application accepted by Commissioner 
of Customs: November 6, 2009.
    Docket Number: 09-065. Applicant: U.S. Department of Homeland 
Security, Science and Technology Directorate, Office of National Labs, 
National Biodefense Analysis and Countermeasures Center, 8300 Research 
Plaza, Ft. Detrick, Frederick, MD 21702. Instrument: Scanning Electron 
Microscope, Quanta 200 FEG. Manufacturer: FEI Company, Czech Republic. 
Intended Use: The instrument will be used to study biological agents 
and specimens at the cellular and genomic levels. The instrument is an 
environmental/field emission system that allows specimens to be viewed 
without dehydration, a feature that can save time and allow greater 
flexibility in experimentation. This instrument provides the most 
automated functions (alignment, stigmation, focus) that significantly 
improve the quality and volume of observations. Justification for Duty-
Free Entry: No instruments of same general category are manufactured in 
the United States. Application accepted by Commissioner of Customs: 
November 13, 2009.

    Dated: December 14, 2009.
Christopher Cassel,
Director, IA Subsidies Enforcement Office.
[FR Doc. E9-30322 Filed 12-18-09; 8:45 am]
BILLING CODE 3510-DS-P