[Federal Register Volume 74, Number 234 (Tuesday, December 8, 2009)]
[Notices]
[Pages 64662-64663]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: E9-29235]


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DEPARTMENT OF COMMERCE

International Trade Administration


Honolulu Police Department - SIS, et al., Notice of Consolidated 
Decision on Applications for Duty-Free Entry of Electron Microscopes

This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, as amended by Pub. L. 106-36; 80

[[Page 64663]]

Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 
A.M. and 5:00 P.M. in Room 3705, U.S. Department of Commerce, 14th and 
Constitution Avenue., NW, Washington, D.C.
Docket Number: 09-058. Applicant: Honolulu Police Department-SIS, 
Honolulu, HI 96813. Instrument: Electron Microscope. Manufacturer: FEI 
Company, Czech Republic. Intended Use: See notice at 74 FR 58001, 
November 10, 2009.
Docket Number: 09-060. Applicant: University of California at San 
Francisco, San Francisco, CA 94103. Instrument: Electron Microscope. 
Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 74 FR 
58001, November 10, 2009.
Docket Number: 09-061. Applicant: Argonne National Laboratory, Lemont, 
IL 60439. Instrument: Electron Microscope. Manufacturer: JEOL, Ltd., 
Japan. Intended Use: See notice at 74 FR 58001, November 10, 2009.
Docket Number: 09-062. Applicant: Department of Homeland Security, 
Fredrick, MD 21702. Instrument: Electron Microscope. Manufacturer: FEI 
Company, Czech Republic. Intended Use: See notice at 74 FR 58001, 
November 10, 2009.
Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as these instruments are intended to be used, was being 
manufactured in the United States at the time the instruments were 
ordered. Reasons: Each foreign instrument is an electron microscope and 
is intended for research or scientific educational uses requiring an 
electron microscope. We know of no electron microscope, or any other 
instrument suited to these purposes, which was being manufactured in 
the United States at the time of order of each instrument.

    Dated: December 1, 2009.
Christopher Cassel,
Director, Subsidies Enforcement Office, Import Administration.
[FR Doc. E9-29235 Filed 12-7-09; 8:45 am]
BILLING CODE 3510-DS-S