[Federal Register Volume 74, Number 216 (Tuesday, November 10, 2009)]
[Notices]
[Pages 58001-58002]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: E9-27070]


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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before November 30, 2009. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5 p.m. at the U.S. Department of 
Commerce in Room 3720.
    Docket Number: 09-058. Applicant: Honolulu Police Department--SIS, 
801 S. Beretania St., Honolulu, HI 96813. Instrument: Electron 
Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: 
The instrument will be used for forensic analysis of trace evidence 
samples, primarily for particle analysis of gunshot residue. 
Justification for Duty-Free Entry: No instruments of same general 
category are manufactured in the United States. Application accepted by 
Commissioner of Customs: October 9, 2009.
    Docket Number: 09-060. Applicant: University of California at San 
Francisco, 1855 Folsom St., Suite 304, San Francisco, CA 94103. 
Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. 
Intended Use: The instrument will be used to study the ultrastructural 
characteristics of biological tissue, such as the number, size and 
shape of cellular connections and gap junctions in the brain. 
Justification for Duty-Free Entry: No instruments of same general 
category are manufactured in the United States. Application accepted by 
Commissioner of Customs: October 19, 2009.
    Docket Number: 09-061. Applicant: Argonne National Laboratory, 9700 
S. Cass Ave., Lemont, IL 60439.

[[Page 58002]]

Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. 
Intended Use: This instrument will be used for the study of nanoscale 
magnetic and ferroelectric materials. Specifically, it will be used to 
study the magnetic domain or ferroelectric domain behavior of the such 
materials. The resolution of the instrument is such that it can 
correlate domain behavior directly with microstructure. Justification 
for Duty-Free Entry: No instruments of same general category are 
manufactured in the United States. Application accepted by Commissioner 
of Customs: October 19, 2009.
    Docket Number: 09-062. Applicant: Department of Homeland Security, 
Science & Technology Directorate, Office of National Labs, National 
Bio-defense analysis and Countermeasures Center, 8300 Research Plaza, 
Fort Detrick, Frederick, MD 21702. Instrument: Electron Microscope. 
Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument 
will be used to study biological agents and specimens at the cellular 
and genomic level. Justification for Duty-Free Entry: No instruments of 
same general category are manufactured in the United States. 
Application accepted by Commissioner of Customs: October 21, 2009.

    Dated: November 3, 2009.
Christopher Cassel,
Director, IA Subsidies Enforcement Office.
[FR Doc. E9-27070 Filed 11-9-09; 8:45 am]
BILLING CODE 3510-DS-P