[Federal Register Volume 74, Number 186 (Monday, September 28, 2009)]
[Notices]
[Page 49364]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: E9-23368]



[[Page 49364]]

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DEPARTMENT OF COMMERCE

International Trade Administration


Air Force Research Laboratory et al.; Notice of Decision on 
Applicationfor Duty-Free Entry of Scientific Instruments

    This is a decision pursuant to Section 6(c) of the Educational, 
Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89-
651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301). 
Related records can be viewed between 8:30 a.m. and 5 p.m. in Room 
3705, U.S. Department of Commerce, 14th and Constitution Ave, NW., 
Washington, DC.
    Comments: None received. Decision: Approved. We know of no 
instruments of equivalent scientific value to the foreign instrument 
described below, for such purposes as this is intended to be used, that 
was being manufactured in the United States at the time of its order.
    Docket Number: 09-045. Applicant: Air Force Research Laboratory, 
Wright-Patterson AFB, OH 45433. Instrument: Tilting Goniometer Stages, 
with Resistive Encoders. Manufacturer: Attocube Systems AG, Germany. 
Intended Use: See notice at 74 FR 44350, August 28, 2009. Reasons: This 
instrument is unique and is essential to enable the characterization 
and measurement of micromechanical properties of structural aerospace 
metals. Specifically, the instrument can move linear position less than 
5nm wide and to move objects to distances over 5nm and has millidegree 
resolution and a range of tilt of at least 5 degrees. No domestic 
sources make devices with similar capabilities.
    Docket Number: 09-046. Applicant: National Renewable Energy 
Laboratory, Golden, CO 80401. Instrument: Sidewinder Upgrade (ion 
column) Accessory for Electron Microscope. Manufacturer: FEI Company, 
the Netherlands. Intended Use: See notice at 74 FR 44350, August 28, 
2009. Reasons: This instrument is unique and is essential to the study 
of the chemistry, crystallography and structural morphology of 
materials used in the development of photovoltaic devices. We know of 
no electron microscope, or accessory thereto, suited to these purposes, 
which was being manufactured in the United States at the time of order 
of this instrument.

    Dated: September 22, 2009.
Christopher D. Cassel,
Director, Subsidies Enforcement Office, Import Administration.
[FR Doc. E9-23368 Filed 9-25-09; 8:45 am]
BILLING CODE 3510-DS-P