[Federal Register Volume 74, Number 176 (Monday, September 14, 2009)]
[Notices]
[Page 46973]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: E9-22049]


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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

Pursuant to Section 6(c) of the Educational, Scientific and Cultural 
Materials Importation Act of 1966 (Pub. L. 89-651, as amended by Pub. 
L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments on the 
question of whether instruments of equivalent scientific value, for the 
purposes for which the instruments shown below are intended to be used, 
are being manufactured in the United States.
Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations 
and be postmarked on or before October 5, 2009. Address written 
comments to Statutory Import Programs Staff, Room 3720, U.S. Department 
of Commerce, Washington, DC 20230. Applications may be examined between 
8:30 A.M. and 5:00 P.M. at the U.S. Department of Commerce in Room 
3720.
Docket Number: 09-048. Applicant: North Dakota State University, 1301 
12th Ave. North, Fargo, ND 58102. Instrument: Electron Microscope. 
Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument 
will be used to inspect semiconductor devices and micro sensors; study 
nanoparticles, nanotubes, polymers and composites; and to create micro 
to nanoscale channels for fluidics research. Justification for Duty-
Free Entry: No instruments of same general category are manufactured in 
the United States. Application accepted by Commissioner of Customs: 
August 18, 2009.
Docket Number: 09-049. Applicant: Washington State University, 220 
French Administration Building, P.O. Box 641020, Pullman, WA 99164. 
Instrument: Electron Microscope. Manufacturer: FEI Company, Czech 
Republic. Intended Use: The instrument will be used to inspect 
semiconductor devices and micro sensors; study nanoparticles, 
nanotubes, polymers and composites; and to create micro to nanoscale 
channels for fluidics research. Justification for Duty-Free Entry: No 
instruments of same general category are manufactured in the United 
States. Application accepted by Commissioner of Customs: August 18, 
2009.
Docket Number: 09-050. Applicant: Stanford University, 450 Serra Mall, 
Stanford, CA 94305. Instrument: Electron Microscope. Manufacturer: FEI 
Company, the Netherlands. Intended Use: The instrument will be used for 
``spectrum imaging'' of elemental distributions at the sub-nano level, 
to gather three-dimensional structural information of nano-sized 
crystals as well as to measure electrostatic and magnetic fields in a 
variety of samples. Justification for Duty-Free Entry: No instruments 
of same general category are manufactured in the United States. 
Application accepted by Commissioner of Customs: August 18, 2009.

    Dated: September 8, 2009.
Christopher Cassel,
Director, IA Subsidies Enforcement Office.
[FR Doc. E9-22049 Filed 9-11-09; 8:45 am]
BILLING CODE 3510-DS-S