[Federal Register Volume 74, Number 69 (Monday, April 13, 2009)]
[Notices]
[Pages 16835-16836]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: E9-8396]


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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

Pursuant to Section 6(c) of the Educational, Scientific and Cultural 
Materials Importation Act of 1966 (Pub. L. 89-651, as amended by Pub. 
L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments on the 
question of whether instruments of equivalent scientific value, for the 
purposes for which the instruments shown below are intended to be used, 
are being manufactured in the United States.
Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations 
and be postmarked on or before May 4, 2009. Address written comments to 
Statutory Import Programs Staff, Room 3720, U.S. Department of 
Commerce, Washington, D.C. 20230. Applications may be examined between 
8:30 A.M. and 5:00 P.M. at the U.S. Department of Commerce in Room 
3720.
Docket Number: 09-008. Applicant: National Institute of Standards and 
Technology, 100 Bureau Drive, Gaithersburg, MD 20899. Instrument: 
Electron Microscope. Manufacturer: FEI Company, the Netherlands. 
Intended Use: The instrument will be used to study the compositional 
characterization of complex, compositionally heterogeneous materials at 
the sub-nanometer scale. This includes materials such as advanced on-
chip interconnects, semiconductor nanowires and thin film and other 
nano-structured materials. Justification for Duty-Free Entry: No 
instruments of the same general category as the foreign instrument 
begin manufactured in the United States. Application accepted by 
Commissioner of Customs: March 17, 2009.


[[Page 16836]]


    Dated: April 6, 2009.
Christopher Cassel,
Acting Director, IA Subsidies Enforcement Office.
[FR Doc. E9-8396 Filed 4-10-09; 8:45 am]
BILLING CODE: 3510-DS-S