[Federal Register Volume 74, Number 31 (Wednesday, February 18, 2009)]
[Notices]
[Page 7588]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: E9-3406]


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DEPARTMENT OF COMMERCE

International Trade Administration


Applications for Duty-Free Entry of Scientific Instruments

Pursuant to Section 6(c) of the Educational, Scientific and Cultural 
Materials Importation Act of 1966 (Pub. L. 89-651, as amended by Pub. 
L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments on the 
question of whether instruments of equivalent scientific value, for the 
purposes for which the instruments shown below are intended to be used, 
are being manufactured in the United States.
Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations 
and be postmarked on or before March 10, 2009. Address written comments 
to Statutory Import Programs Staff, Room 3720, U.S. Department of 
Commerce, Washington, D.C. 20230. Applications may be examined between 
8:30 A.M. and 5:00 P.M. at the U.S. Department of Commerce in Room 
3720.
Docket Number: 08-050. Applicant: University of Colorado, Department of 
Mechanical Engineering, 427 UCB, ECME 114, Boulder, CO 80309-0427. 
Instrument: Dual Beam FIB Electron Microscope. Manufacturer: FEI 
Company, Czech Republic. Intended Use: The instrument will be used to 
fabricate micrometer/nanometer scale devices and test samples in the 
Nanomaterials Characterization Facility. Application accepted by 
Commissioner of Customs: September 25, 2008.
Docket Number: 08-051. Applicant: Lawrence Berkeley National 
Laboratory, One Cyclotron Road, MS: 937-0200, Berkeley, CA 94720. 
Instrument: Electron Microscope. Manufacturer: FEI Company, The 
Netherlands. Intended Use: The instrument will be used to develop a new 
class of electron imaging, down to resolution, which can provide new 
capabilities including an in-situ experimental stage. Application 
accepted by Commissioner of Customs: September 30, 2008.
Docket Number: 08-062. Applicant: Carnegie Mellon University, 5000 
Forbes Avenue, Pittsburgh, PA 15213. Instrument: Scanning Electron 
Microscope. Manufacturer: FEI Company, The Netherlands. Intended Use: 
The instrument is to be equipped with an orientation imaging system for 
the study of grain boundary energy on a wide range of materials, 
including metals, ceramics and semiconductors. Application accepted by 
Commissioner of Customs: January 14, 2009.

    Dated: February 12, 2009.
Chris Cassel,
Acting Director, IA Subsidies Enforcement Office.
[FR Doc. E9-3406 Filed 2-17-09; 8:45 am]
BILLING CODE 3510-DS-S