[Federal Register Volume 74, Number 26 (Tuesday, February 10, 2009)]
[Notices]
[Pages 6575-6576]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: E9-2759]


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DEPARTMENT OF COMMERCE

National Institute of Standards and Technology


Notice of Inventions Available for Licensing

AGENCY: National Institute of Standards and Technology, Commerce.

SUMMARY: The inventions listed below are owned in whole or in part by 
the U.S. Government, as represented by the Secretary of Commerce. The 
U.S. Government's interest in these inventions is available for 
licensing in accordance with 35 U.S.C. 207 and 37 CFR Part 404 to 
achieve expeditious commercialization of results of federally funded 
research and development.

FOR FURTHER INFORMATION CONTACT: Technical and licensing information on 
these inventions may be obtained by writing to: National Institute of 
Standards and Technology, Office of Technology Partnerships, Attn: Mary 
Clague, Building 222, Room A240, Gaithersburg, MD 20899. Information is 
also available via telephone: 301-975-4188, fax 301-975-3482, or e-
mail: [email protected]. Any request for information should include 
the NIST Docket number and title for the invention as indicated below.

SUPPLEMENTARY INFORMATION: NIST may enter into a Cooperative Research 
and Development Agreement (``CRADA'') with the licensee to perform 
further research on the invention for purposes of commercialization. 
The inventions available for licensing are:

[NIST Docket Number: 07-002]

    Title: Zero Order Overly Targets.
    Abstract: This invention consists of a method and target design for 
overlay measurements using optical methods. The key is twofold. One 
aspect is to allow optical overlay measurements using device-sized 
dimensions and very dense targets while at the same time using only 
conventional image based methods. The other aspect is to enable a 
magnification of the actual overlay by factors of 10 or 20, for 
example, based on the relative values of the to be described pitch. 
That is, a 2 nm actual overlay offset can yield a 20 run or 40 nm 
offset in the reflected signal. The new target designs are unique for 
overlay and provide a new and revolutionary technique for overlay 
measurements using overlaid dense structures. This technique has no 
immediate limitation on feature size and density and in fact very dense 
features will perform well using this technique.

[NIST Docket Number: 08-002]

    Title: Design Modifications and Attachment to the Home Lift 
Position and Rehabilitation (HLPR) Chair.
    Abstract: This invention is owned in whole by the U.S. Government. 
The invention provides a number of improvements to the original NIST 
Home Lift Position and Rehabilitation (HLPR) Chair. The HLPR Chair 
provides lift and mobility capabilities to those dependent on 
wheelchairs not otherwise available and greatly reduces reliance on 
healthcare workers to assist in moving a patient to/from the toilet, 
bed, or rehabilitation.


[[Page 6576]]


    Dated: February 4, 2009.
Patrick Gallagher,
Deputy Director.
[FR Doc. E9-2759 Filed 2-9-09; 8:45 am]
BILLING CODE 3510-13-P