[Federal Register Volume 74, Number 20 (Monday, February 2, 2009)]
[Notices]
[Page 5819]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: E9-2194]


-----------------------------------------------------------------------

DEPARTMENT OF COMMERCE

International Trade Administration


Applications for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before February 23, 2009. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5 p.m. at the U.S. Department of 
Commerce in Room 3720.
    Docket Number: 08-054. Applicant: University of Wisconsin--Madison, 
Purchasing Services, 21 N. Park Street, Suite 6101, Madison, WI 53715-
1218. Instrument: FEI Titan 80-200 Electron Microscope. Manufacturer: 
FEI Company, Czech Republic. Intended Use: The instrument will be used 
to measure the structure, composition and bonding of a wide variety of 
materials and phenomena, such as semiconducting and metallic glasses, 
superconductors including magnesium diboride, semiconductors including 
zinc oxide, geochemical reactions confined to natural nanopores in 
minerals, nanotubes of titanium dioxide and related oxides with and 
without loading of catalytic nanoparticles, and metal nanoparticles 
used as labels in cells. Application accepted by Commissioner of 
Customs: October 8, 2008.
    Docket Number: 08-059. Applicant: Emory University, 1599 Clifton 
Road, 4th Floor, Atlanta, GA 30322-4250. Instrument: Electron 
Microscope, Model JEM-1011. Manufacturer: JEOL, Japan. Intended Use: 
The instrument will be used in anatomical studies to help students 
understand a disease such as Parkinson's. Specifically, students will 
be able to visualize axonal tracers after intracerebral injection, 
perfusion, sectioning, incubations, EM processing, embedding, ultra-
thin sectioning and observation at the electron microscope level. 
Application accepted by Commissioner of Customs: December 16, 2008.
    Docket Number: 08-060. Applicant: University of Arizona, Department 
of Chemistry, 1306 E. University Boulevard, Tucson, AZ 85721. 
Instrument: FEI Inspect S Scanning Electron Microscope. Manufacturer: 
FEI Company, Czech Republic. Intended Use: The instrument will be used 
to characterize a wide variety of materials in terms of surface 
morphology and chemical composition. It will also be used as the base 
system for an electron beam lithography module which will be used to 
pattern and characterize nano-scale features that represent the next 
generation of molecular electronic devices, and as the base system for 
an Energy Dispersive Spectrometer that will allow the chemical mapping 
at the same resolution as the SEM images. Application accepted by 
Commissioner of Customs: December 16, 2008.

    Dated: January 27, 2009.
Chris Cassel,
Director, Statutory Import Programs Staff, Import Administration.
[FR Doc. E9-2194 Filed 1-30-09; 8:45 am]
BILLING CODE 3510-DS-P