[Federal Register Volume 73, Number 227 (Monday, November 24, 2008)]
[Notices]
[Page 70961]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: E8-27888]


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DEPARTMENT OF COMMERCE

International Trade Administration


Applications for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Public Law 106-36; 80 Stat. 897; 15 CFR part 301), we invite 
comments on the question of whether instruments of equivalent 
scientific value, for the purposes for which the instruments shown 
below are intended to be used, are being manufactured in the United 
States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before December 15, 2008. Address 
written comments to Statutory Import Programs Staff, Room 2104, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m.and 5:30 p.m. at the U.S. Department of 
Commerce in Room 2104.
    Docket Number: 08-057. Applicant: Louisiana State University, 
Department of Chemistry, 232 Choppin Hall, Baton Rouge, LA 70803. 
Instrument: Electron Microscope, Model FEI Quanta 3D FEG DualBeam. 
Manufacturer: FEI Company, the Netherlands. Intended Use: The 
instrument is intended to be used for large area cross-sectioning and 
analytical work, automated 3D tomography, nanolithography, and TEM 
specimen preparation. This type of work necessitates a high performance 
Dualbeam system with Environmental SEM capabilities. Application 
accepted by Commissioner of Customs: October 21, 2008.
    Docket Number: 08-058. Applicant: University of New Mexico, Center 
for Micro-Engineered Materials, MSC01 1120 Farris Eng. CTR 203, 1 
University of New Mexico, Albuquerque, NM 87131. Instrument: Electron 
Microscope, Model FEI Quanta 3D FEG Focused Ion Beam. Manufacturer: FEI 
Company, the Netherlands. Intended Use: The instrument is intended to 
be used to study nanoscale materials. Specifically, it will be used for 
the study of heterogeneous catalysts, heteraoepitaxial semiconductors, 
quantum dots, lasers, microfluidic devices, ion channels, free-standing 
thin films, biosensors and for the study of interplanetary materials 
and meteorites. Application accepted by Commissioner of Customs: 
October 21, 2008.

    Dated: November 18, 2008.
Christopher Cassel,
Acting Director, Subsidies Enforcement Office, Import Administration.
[FR Doc. E8-27888 Filed 11-21-08; 8:45 am]
BILLING CODE 3510-DS-P