[Federal Register Volume 73, Number 207 (Friday, October 24, 2008)]
[Notices]
[Page 63434]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: E8-25437]


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DEPARTMENT OF COMMERCE

International Trade Administration


Applications for Duty-Free Entry of Scientific Instruments

Pursuant to Section 6(c) of the Educational, Scientific and Cultural 
Materials Importation Act of 1966 (Pub. L. 89-651, as amended by Pub. 
L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments on the 
question of whether instruments of equivalent scientific value, for the 
purposes for which the instruments shown below are intended to be used, 
are being manufactured in the United States.
Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations 
and be postmarked on or before November 13, 2008. Address written 
comments to Statutory Import Programs Staff, Room 2104, U.S. Department 
of Commerce, Washington, D.C. 20230. Applications may be examined 
between 8:30 A.M. and 5:00 P.M. at the U.S. Department of Commerce in 
Room 2104.
Docket Number: 08-048. Applicant: University of Puerto Rico, P.O. Box 
23334, San Juan, PR 00931-3334. Instrument: Electron Microscope, Model 
JEM 2100-F. Manufacturer: JEOL Ltd., Japan. Intended Use: The 
instrument is intended to be used for materials characterization, 
including microscopy and elemental analysis at nanometer dimensions and 
at atomic resolution. A unique feature of this the instrument is that 
it has a variable voltage Field Emission electron source with an energy 
filter and X-ray fluorescence detector. Application accepted by 
Commissioner of Customs: September 24, 2008.
Docket Number: 08-049. Applicant: University of Puerto Rico, P.O. Box 
23334, San Juan, PR 00931-3334. Instrument: Electron Microscope, Model 
JEM 2200-FS. Manufacturer: JEOL Ltd., Japan. Intended Use: The 
instrument is intended to be used for materials characterization, 
including microscopy and elemental analysis at nanometer dimensions and 
at atomic resolution. A unique feature of this the instrument is that 
it has a 200kV Field Emission electron source with an energy filter and 
X-ray fluorescence detector. Application accepted by Commissioner of 
Customs: September 24, 2008.
Docket Number: 08-053. Applicant: Purdue University, 701 Northwester 
Ave., School of Materials Engineering, West Lafayette, IN 47907. 
Instrument: Electron Microscope, Model Tecnai G2 F20 TEM. Manufacturer: 
FEI Company, Czech Republic. Intended Use: The instrument is intended 
to be used to study the composition and structure of materials such as 
metals, semiconductors, ceramic, polymers and biomaterials through 
standard electron microscopy techniques. More specifically, the 
instrument will be used to demonstrate the use of electron diffraction 
and light field and dark field imaging in characterizing the structure 
and composition of these materials. Application accepted by 
Commissioner of Customs: October 3, 2008.

    Dated: October 20, 2008.
Faye Robinson,
Director, Statutory Import Programs Staff.
[FR Doc. E8-25437 Filed 10-23-04; 8:45 am]
BILLING CODE 3510-DS-S