[Federal Register Volume 73, Number 150 (Monday, August 4, 2008)]
[Notices]
[Pages 45209-45210]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: E8-17805]


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DEPARTMENT OF COMMERCE

International Trade Administration


Application for Duty-Free Entry of Scientific Instruments

Pursuant to Section 6(c) of the Educational, Scientific and Cultural 
Materials Importation Act of 1966 (Pub. L. 89-651; as amended by Pub. 
L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments on the 
question of whether instruments of equivalent scientific value, for the 
purposes for which the instruments shown below are intended to be used, 
are being manufactured in the United States.
Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations 
and be filed within 20 days with the Statutory Import Programs Staff, 
U.S. Department of Commerce 14th and Constitution Ave., NW, Room 2104 
Washington, D.C. 20230. Applications may be examined between 8:30 A.M. 
and 5:00 P.M. in Room 2104, U.S. Department of Commerce.
Docket Number: 08-032. Applicant: University of Maryland, Institute for 
Research in Electronics and Applied Physics, Energy Research Building 
223, College Park, MD 20742. Instrument: Atomic Layer 
Deposition System. Manufacturer: Beneq Oy, Finland. Intended Use: The 
instrument is intended to be used to fabricate ultra thin, nanometer- 
or atomic-scale films of insulators and metals for unique nanodevices 
and nanostructures. The films will be evaluated for their purity, 
optical and electrical properties and their suitability for 
applications ranging from nanoscale electronics, optics and sensing 
devices and circuits. This instrument must be able to accommodate a 
variety of substrates of dissimilar sizes and shapes, including medical 
implants and flexible integrated circuits. The instrument must also be 
able to accommodate 3-D samples and must have a minimum of six sources 
per reactor. Application accepted by Commissioner of Customs: June 25, 
2008.
Docket Number: 08-036. Applicant: University of Maryland, 1220 Physics 
Department, College Park, MD 20742. Instrument: Low Temperature Near 
Field Confocal Optical Microscope. Manufacturer: Nanonics Imaging Ltd, 
Israel. Intended Use: The instrument is intended to be used to 
investigate fundamental physics properties and device applications of a 
variety of precisely engineered nanoscale structures. The following 
features are essential in performing the above mentioned research: 
simultaneous NSOM/AFM/Confocal imaging, normal force sensing open 
system architecture (transmission, reflection and collection modes), 
temperature continuously adjustable from 8K to 300K, 5x10[macr][bds8] 
Torr high vacuum capability, large scanning range (50[micro]*m in the Z 
direction), fine NSOM spatial resolution (~50nm), multi-probe 
capability for independent pump probe measurement control, fast 
temporal resolution (~300fs). Application accepted by Commissioner of 
Customs: July 15, 2008.
Docket Number: 08-038. Applicant: Washington State University, 100 
Dairy Road, Pullman, Washington 99164-7040. Instrument: Piezoelectric 
Microarray Spotter. Manufacturer: Scienion AG, Germany. Intended Use: 
The instrument is intended to be used to construct the microarrays 
needed to conduct research on the comparative genomics and comparative 
transcriptomics of bacterial pathogens. A unique feature of this 
instrument is that it is a non-contact spotter to avoid interference 
from dust and sensitivity to shifts in relative humidity. The 
instrument must also be able to be used as a liquid handling robot. 
Application accepted by Commissioner of Customs: July 16, 2008.
Docket Number: 08-039. Applicant: University of Michigan-Dearborn, 4901 
Evergreen Road, Room 207 CIS, Dearborn, MI 48128. Instrument: X-Ray 
Computer Tomography System. Manufacturer: Phoenix X-Ray Inc., Germany. 
Intended Use: The instrument is intended to be used to study the 
fracture and damage mechanisms of engineering materials. Specifically, 
3-D cracks and voids will be traced during a continuous loading 
process. A requirement for this instrument is that

[[Page 45210]]

it have an X-ray tube power high enough to penetrate metal alloy 
specimens. It must also have a relatively high resolution. Application 
accepted by Commissioner of Customs: July 17, 2008.

    Date July 29, 2008.
Faye Robinson,
Director, Statutory Import Programs Staff, Import Administration.
[FR Doc. E8-17805 Filed 8-1-08; 8:45 am]
BILLING CODE 3510-DS-S