[Federal Register Volume 73, Number 102 (Tuesday, May 27, 2008)]
[Notices]
[Page 30378]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: E8-11761]


-----------------------------------------------------------------------

DEPARTMENT OF COMMERCE

International Trade Administration


Applications for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before June 16, 2008. Address 
written comments to Statutory Import Programs Staff, Room 2104, U.S. 
Department of Commerce, Washington, D.C. 20230. Applications may be 
examined between 8:30 A.M. and 5:00 P.M. at the U.S. Department of 
Commerce in Room 2104.
    Docket Number: 08-019. Applicant: Texas Christian University, 2800 
South University Drive, Fort Worth, Texas 76129. Instrument: Electron 
Microscope, Model JEM-2100. Manufacturer: JEOL, Inc., Japan. Intended 
Use: The instrument is intended to be used to study inorganic solid 
nanostructures and biological materials, in particular their structure 
and composition. These materials will be structurally characterized 
using the electron microscope and, depending on their composition, may 
undergo subsequent analysis for their optical, electrical, or 
biological activity. Application accepted by Commissioner of Customs: 
May 5, 2008.
    Docket Number: 08-023. Applicant: Washington University in St. 
Louis, 1 Brookings Drive, University City, MO 63130. Instrument: 
Electron Microscope, Model Tecnai G2 Spirit Twin. Manufacturer: FEI 
Company, Czech Republic. Intended Use: The instrument is intended to be 
used to analyze the surface morphology, shape, size, size-distribution, 
uniformity and chemical composition of various materials, including 
nanostructured metals, metal-oxides, semiconductors, polymers, polymer 
fibers and biological materials. Application accepted by Commissioner 
of Customs: May 14, 2008.
    Docket Number: 08-024. Applicant: Washington University in St. 
Louis, 1 Brookings Drive, University City, MO 63130. Instrument: 
Electron Microscope, Model Nova NanoSEM 230 . Manufacturer: FEI 
Company, Czech Republic. Intended Use: The instrument is intended to be 
used to analyze the surface morphology, shape, size, size-distribution, 
uniformity and chemical composition of various materials, including 
nanostructured metals, metal-oxides, semiconductors, polymers, polymer 
fibers and biological materials. Application accepted by Commissioner 
of Customs: May 14, 2008.

    Dated: May 21, 2008.
Faye Robinson,
Director, Statutory Import Programs Staff.
[FR Doc. E8-11761 Filed 5-23-08; 8:45 am]
BILLING CODE 3510-DS-S