[Federal Register Volume 72, Number 233 (Wednesday, December 5, 2007)]
[Notices]
[Page 68568]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: E7-23576]


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DEPARTMENT OF COMMERCE

International Trade Administration


Battelle Memorial Institute, et al.; Notice of Consolidated 
Decision on Applications for Duty-Free Entry of Electron Microscopes

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, as amended by Pub. L. 106-36, 80 Stat. 897; 15 CFR 
part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. 
in Room 2104, U.S. Department of Commerce, 14th and Constitution 
Avenue, NW., Washington, DC.

    Docket Number: 07-062. Applicant: Battelle Memorial Institute, 
Richland, WA 99354. Instrument: Electron Microscope, Model FIB/SEM. 
Manufacturer: FEI Company, Netherlands. Intended Use: See notice at 
72 FR 63875, November 13, 2007.

    Docket Number: 07-063. Applicant: University of California, San 
Diego, La Jolla, CA 92093-0608. Instrument: Electron Microscope, 
Model Titan 80-300 C-Twin STEM. Manufacturer: FEI Company, 
Netherlands. Intended Use: See notice at 72 FR 63875, November 13, 
2007.

    Docket Number: 07-066. Applicant: St. Jude Children's Research 
Hospital, Memphis, TN 38105. Instrument: Electron Microscope, Model 
Tecnai G2 F20 TWIN. Manufacturer: FEI Company, Netherlands. Intended 
Use: See notice at 72 FR 63875, November 13, 2007.

    Docket Number: 07-067. Applicant: National Institute for 
Occupational Safety and Health, Cincinnati, OH 45226. Instrument: 
Electron Microscope, Model JEM-2100F. Manufacturer: Jeol Ltd., 
Japan. Intended Use: See notice at 72 FR 63875, November 13, 2007.

    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as these instruments are intended to be used, was being 
manufactured in the United States at the time the instruments were 
ordered. Reasons: Each foreign instrument is an electron microscope 
and is intended for research or scientific educational uses 
requiring an electron microscope. We know of no electron microscope, 
or any other instrument suited to these purposes, which was being 
manufactured in the United States at the time of order of each 
instrument.

Faye Robinson,
Director, Statutory Import Programs Staff, Import Administration.
[FR Doc. E7-23576 Filed 12-4-07; 8:45 am]
BILLING CODE 3510-DS-P