[Federal Register Volume 72, Number 175 (Tuesday, September 11, 2007)]
[Notices]
[Page 51801]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: E7-17867]


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DEPARTMENT OF COMMERCE

International Trade Administration


University of Southern California, et al.; Notice of Consolidated 
Decision on Applications for Duty-Free Entry of Electron Microscopes

    This is a decision consolidated pursuant to section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be 
viewed between 8:30 a.m. and 5 p.m. in Room 2104, U.S. Department of 
Commerce, 14th and Constitution Avenue., NW., Washington, DC.
    Docket Number: 07-047. Applicant: University of Southern 
California, Los Angeles, CA. Instrument: Electron Microscope, Model 
JEM-1400. Manufacturer: JEOL, Ltd., Japan. Intended Use: See notice at 
72 FR 46037, August 16, 2007.
    Docket Number: 07-050. Applicant: University of Massachusetts 
Medical School, Worcester, MA. Instrument: Electron Microscope, Model 
Quanta 200 FEG. Manufacturer: FEI, Company, Czech Republic. Intended 
Use: See notice at 72 FR 46037, August 16, 2007.
    Docket Number: 07-049. Applicant: Indiana University. Instrument: 
Electron Microscope, Model JEM-3200FS. Manufacturer: JEOL Ltd., Japan. 
Intended Use: See notice at 72 FR 46037, August 16, 2007.
    Docket Number: 06-042. Applicant: The University of Illinois at 
Urbana-Champaign, Champaign, IL. Instrument: Electron Microscope, Model 
JEM-2200FS. Manufacturer: JEOL, Ltd., Japan. Intended Use: See notice 
at 72 FR 46037, August 16, 2007.
    Docket Number: 07-052. Applicant: Scripps Research Institute, La 
Jolla, CA. Instrument: Electron Microscope, (2), Tecnai G2 Spirit TWIN 
and Morgagni TEM. Manufacturer: FEI Company, Czech Republic. Intended 
Use: See notice at 72 FR 46037, August 16, 2007.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as these instruments are intended to be used, was being 
manufactured in the United States at the time the instruments were 
ordered. Reasons: Each foreign instrument is an electron microscope and 
is intended for research or scientific educational uses requiring an 
electron microscope. We know of no electron microscope, or any other 
instrument suited to these purposes, which was being manufactured in 
the United States at the time of order of each instrument.

Faye Robinson,
Director, Statutory Import Programs Staff, Import Administration.
 [FR Doc. E7-17867 Filed 9-10-07; 8:45 am]
BILLING CODE 3510-DS-P