[Federal Register Volume 72, Number 132 (Wednesday, July 11, 2007)]
[Notices]
[Page 37729]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: E7-13477]


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DEPARTMENT OF COMMERCE

International Trade Administration


University of Minnesota, et al., Notice of Consolidated Decision 
on Applications for Duty-Free Entry of Scientific Instruments

This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be 
viewed between 8:30 A.M. and 5 P.M. in Room 2104, U.S. Department of 
Commerce, 14th and Constitution Ave., NW., Washington, DC.
Comments: None received. Decisions: Approved. We know of no instrument 
of equivalent scientific value to the foreign instruments described 
below, for such purposes as each is intended to be used, was being 
manufactured in the United States at the time of its order.
Docket Number: 07-025. Applicant: University of Minnesota, Minneapolis, 
MN 55455. Instrument: Confocal Raman Microscope. Manufacturer: Witec, 
Germany. Intended Use: See notice at 72 FR 33204, June 15, 20007. 
Reasons: The foreign instrument provides capability for distinguishing 
polymorphs in organic crystalline films, identifying components in 
polymer blends at the micron level, distinguishing components in 
complex biofilms, characterizing the surface composition of coated 
aerosol particles, etc. Precise mapping control through a piezo scan 
table, as well as high resolution and adaptation to different 
wavelengths of the laser are essential features.
Docket Number: 07-034. Applicant: Purdue University, West Lafayette, IN 
47907-2054. Instrument: Electron Microscope. Manufacturer: FEI Company, 
The Netherlands. Intended Use: See notice at 72 FR 33204, June 15 2007. 
Reasons: The foreign instrument provides capability of high voltage 
electron microscopy.
Docket Number: 07-035. Applicant: Old Dominion University, Norfolk, VA 
23529. Instrument: Electron Microscope. Manufacturer: JEOL, Ltd., Japan 
Intended Use: See notice at 72 FR 33204. Reasons: The foreign 
instrument provides capability of high voltage electron microscopy.
The capabilities of each of the foreign instruments describedabove are 
pertinent to each applicant's intended purposes and we know of no other 
instrument or apparatus being manufactured in the United States which 
is of equivalent scientific value to any of the foreign instruments.

Faye Robinson,
Director,Statutory Import Programs Staff, Import Administration.
[FR Doc. E7-13477 Filed 7-10-07; 8:45 am]
BILLING CODE 3510-DS-S