[Federal Register Volume 71, Number 216 (Wednesday, November 8, 2006)]
[Notices]
[Pages 65466-65468]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: E6-18915]


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DEPARTMENT OF COMMERCE

International Trade Administration


Applications for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat. 
897; 15 CFR part 301), we invite comments on the question of whether 
instruments of equivalent scientific value, for the purposes for which 
the instruments shown below are intended to be used, are being 
manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be filed within 20 days with the Statutory Import 
Programs Staff, U.S. Department of Commerce, Washington, DC 20230. 
Applications may be examined between 8:30 A.M. and 5 P.M., U.S. 
Department of Commerce, Room 2104, 14th and Constitution Avenue, NW., 
Washington, DC.
    Docket Number: 06-047. Applicant: University of Alabama, 201 7th 
Ave., A129 Bevill Building, Tuscaloosa, AL 33487. Instrument: Electron 
Microscope, Model Quanta 200 3D. Manufacturer: FEI, Czech Republic. 
Intended Use: The instrument is intended to be used to prepare 
transmission electron microscopy specimen foils and perform intricate 
cutting operations at the nano-scale for basic research programs on 
fuel cells, magnetic information storage, catalysis, joining and thin 
films using materials including Pt-alloy nanoparticles, TiAl thin film 
coatings and Cu-Sn alloys for welding. It will also be used for student 
training and operation. Application accepted by Commissioner of 
Customs: July 1, 2006.
    Docket Number: 06-048. Applicant: Harvard Medical School, 25 
Shattuck Street, Boston, MA 02115. Instrument: UV/Vis Upgrade for a 
Confocal Microscope. Manufacturer: Evotech, Germany. Intended Use: The 
article is intended to be used as a compatible accessory for an 
existing Evotec Opera 2.0 System. This extension is an integral part of 
the Opera platform and needs to be installed into the body of the 
microscope system for performing wide-field fluorescence microscopy, 
allowing detection of a greater number of fluorophores used to label 
structures or proteins of interest in cells. Application accepted by 
Commissioner of Customs: July 24, 2006.
    Docket Number: 06-049. Applicant: Harvard Medical Center, 25 
Shattuck Street, Boston, MA 02115. Instrument: Twister II Plate 
Handling Robotic

[[Page 65467]]

Extension for a Confocal Microscope. Manufacturer: Evotech, Germany. 
Intended use: The article is intended to be used as a compatible 
accessory for an existing Evotec Opera 2.0 System. Although the article 
is a product of Caliper LifeSciences, a U.S. company, it was sent to 
Germany where Evotec engineers installed it in order to insure seamless 
operation with the high-throughput microscope system. It allows 
automatic loading of tissue-culture plates onto the stage of the 
microscope for continuous unattended operation. Application accepted by 
Commissioner of Customs: July 24, 2006.
    Docket Number: 06-050. Applicant: The University of Illinois at 
Urbana-Champaign, 616 E. Green Street, Suite 212 Champaign, IL 61820. 
Instrument: Electron Microscope, Model JEM-2100. Manufacturer: JEOL, 
Ltd., Japan. Intended Use: The instrument is intended to be used, among 
other things, for studying (1) relations of structure to catalytic 
activity, (2) strain and composition distribution within 
nanostructures, (3) the effects of impurities on the strength of 
materials, (4) mechanisms for mixing of immiscible systems, (5) 
corrosion mechanisms and products, and (6) structural motifs of 
chromosome architecture and its modification. It will also be used for 
graduate student research. Application accepted by Commissioner of 
Customs: July 27, 2006.
    Docket Number: 06-051. Applicant: Clemson University, AMRL Bldg, 91 
Technology Drive, Anderson, SC 29625. Instrument: Electron Microscope, 
Model S-3400N. Manufacturer: Hitachi High-Technologies Corporation, 
Japan. Intended Use: The instrument is intended to be used to study: 
(1)cellular interaction with nano-particles and development of new 
materials, grain boundaries, erosion, fractured surfaces and failure 
analysis. (2) effects of temperature variations and heat treatment on 
formation of carbon nanotubes. (3) ultra-thin sectioning for evaluation 
of polymer films with embedded nano-structures and cellular studies of 
healthy and diseased cells. It will also be used in courses on 
microscopy and to train graduate students and staff in the use of 
electron microscopes. Application accepted by Commissioner of Customs: 
August 9, 2006.
    Applicant: Docket Number: 06-052. Clemson University, AMRL Bldg, 91 
Technology Drive, Anderson, SC 29625. Instrument: Electron Microscope, 
Model H-9500. Manufacturer: Hitachi High-Technologies Corporation, 
Japan. Intended Use: The instrument is intended to be used to study: 
(1)cellular interaction with nano-particles and development of new 
materials, grain boundaries, erosion, fractured surfaces and failure 
analysis. (2) effects of temperature variations and heat treatment on 
formation of carbon nanotubes and (3) ultra-thin sectioning for 
evaluation of polymer films with embedded nano-structures and cellular 
studies of healthy and diseased cells. It will also be used in courses 
on microscopy and to train graduate students and staff in the use of 
electron microscopes. Application accepted by Commissioner of Customs: 
August 9, 2006.
    Applicant: Docket Number: 06-053. Clemson University, AMRL Bldg, 91 
Technology Drive, Anderson, SC 29625. Instrument: Electron Microscope, 
Model S-4800. Manufacturer: Hitachi High-Technologies Corporation, 
Japan. Intended Use: The instrument is intended to be used to study: 
(1)cellular interaction with nano-particles and development of new 
materials, grain boundaries, erosion, fractured surfaces and failure 
analysis. (2) effects of temperature variations and heat treatment on 
formation of carbon nanotubes. (3) ultra-thin sectioning for evaluation 
of polymer films with embedded nano-structures and cellular studies of 
healthy and diseased cells. It will also be used in courses on 
microscopy and to train graduate students and staff in the use of 
electron microscopes. Application accepted by Commissioner of Customs: 
August 9, 2006.
    Docket Number: 06-054. Applicant: Purdue University, 465 
Northwestern Ave., West Laffayette, IN. Instrument: DFB, Fiber Laser 
System. Manufacturer: Koheras A/S, Denmark. Intended Use: The 
instrument is intended to be used to formulate a fundamental physical 
description of the noise processes of optical frequency combs and their 
application to Optical Arbitrary Waveform Generation by generating an 
ultrastable (ultra-low linewidth) optical frequency via intensity and 
phase modulation of this ultra-low linewidth CW laser, sweeping its 
carrier frequency and beating it with a ``conventional'' mode-locked, 
laser-based optical frequency comb. Optical frequency comb line-by-line 
pulse shaping with RF and ultra-fast optical detection and analysis 
will be employed. Application accepted by Commissioner of Customs: 
September 1, 2006.
    Docket Number: 06-055. Applicant: Southern Illinois University, 
Image Center, 750 Communications Drive, Carbondale, IL 62901. 
Instrument: Electron Microscope, Model H-7650-II. Manufacturer: Hitachi 
High-Technologies Corporation, Japan. Intended Use: The instrument is 
intended to be used in a central, multidisciplinary facility for a wide 
range of research projects involving living organisms, their cell and 
structural details, man-made nanoparticles, friction and wear on 
various surfaces, etc., to digitally capture 3-D images for inspection, 
storage, and transmittal. It will also be used in training courses in 
microscopy for graduate students. Application accepted by Commissioner 
of Customs: August 26, 2006.
    Docket Number: 06-056. Applicant: DHHS/Centers for Disease Control 
& Prevention/Infectious Disease Pathology, 1600 Clifton RD., NE, 
Mailstop G-32, Atlanta, GA 30333. Instrument: Transmission Electron 
Microscope, Model Technai G2 Spirit twin. Manufacturer: FEI, Company, 
The Netherlands. Intended Use: The instrument is intended to be used 
for performance, of among other things, thin section electron 
microscopy, immuno-electron microscopy, in situ electron microscopy, 
and negative stain microscopy. The primary educational purpose is 
derived by publication of research data and high resolution images 
obtained in the course of research as published in peer reviewed 
scientific journals as well as materials available for informing the 
general public. Application accepted by Commissioner of Customs: August 
28, 2006.
    Docket Number: 06-058. Applicant: University of Illinois at 
Chicago, Department of Physics m/c 273, 845 West Taylor Street, 
Chicago, IL 60607-7059. Instrument: Magnesium Fluoride Windows. 
Manufacturer: Laser-Laboratorium, Gottingen, Germany. Intended Use: The 
article is a compatible accessory to reduce glare and improve the beam 
quality associated with an excimer laser system made by the same 
manufacturer and used to study nonlinear optical phenomena and x-ray 
amplification in gases, solids, atomic clusters and plasmas. Measured 
quantities of x-rays and their spectral properties will be examined for 
an understanding of new physics associated with coherent x-ray 
production which will serve as a preamplifier in an ultraviolet laser 
system. Application accepted by

[[Page 65468]]

Commissioner of Customs: October 5, 2006.

Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. E6-18915 Filed 11-7-06; 8:45 am]
BILLING CODE 3510-DS-S