[Federal Register Volume 71, Number 183 (Thursday, September 21, 2006)]
[Notices]
[Pages 55167-55168]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 06-7935]


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DEPARTMENT OF COMMERCE

International Trade Administration


University of Alabama, et al., Notice of Consolidated Decision on 
Applications for Duty-Free Entry of Electron Microscopes

This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be 
viewed between

[[Page 55168]]

8:30 a.m. and 5 p.m. in Room 2104, U.S. Department of Commerce, 
Statutory Import Programs Staff, Room 2104, 14\th\ and Constitution 
Avenue, NW., Washington, DC.
Docket Number: 06-018. Applicant: University of Alabama. Tuscaloosa, AL 
35487. Instrument: Electron Microscope, Model Technai G2 F20 S-TWIN. 
Manufacturer: FEI Company, The Netherlands. Intended Use: See notice at 
71 FR 42631.
Docket Number: 06-019. Applicant: University of Pittsburgh, Pittsburgh, 
PA 15261. Instrument: Electron Microscope, Model JEM-2100F. 
Manufacturer: JEOL Ltd., Japan. See notice at 71 FR 42631.
Docket Number: 06-020. Applicant: Middle Tennessee State University, 
Murfreesboro, TN 37132. Instrument: Electron Microscope, Model H-7650 
TEM. Manufacturer: Hitachi High Technologies, Japan. Intended Use: See 
notice at 71 FR 42631.
Docket Number: 06-021. Applicant: The University of Texas, Dallas, TX 
75390-9056. Instrument: Electron Microscope, Model Technai G2 Spirit 
BioTwin. Manufacturer: FEI Company, Czech Republic. Intended Use: See 
notice at 71 FR 42631.
Docket Number: 06-022. Applicant: Battelle Memorial Institute, Pacific 
Northwest Division, Richland, WA 99352. Instrument: Electron 
Microscope, Model Technai G2 Sprint TWIN. Manufacturer: FEI Company, 
Czech Republic. Intended Use: See notice at 71 FR 42631.
Docket Number: 06-023. Applicant: University of California, Lawrence 
Berkeley Lab for the US Department of Energy, Berkeley, CA 94720. 
Instrument: Electron Microscope, Model JEM-2100. Manufacturer: JEOL, 
Ltd., Japan. Intended Use: See notice at 71 FR 42631.
Docket Number: 06-024. Applicant: The University of Alabama, 
Tuscaloosa, AL 35487-0344. Instrument: Electron Microscope, Model H-
7650-II TEM. Manufacturer: Hitachi High-Technologies Corp, Japan. 
Intended Use: See notice at 71 FR 42631.
Docket Number: 06-025. Applicant: The Ohio State University, Campus 
Microscopy and Imaging Facility, Columbus, OH 43210. Instrument: 
Electron Microscope, Model Technai G2 Spirit BioTwin. Manufacturer: FEI 
Company, Czech Republic. Intended Use: See notice at 71 FR 42631.
Docket Number: 06-026. Applicant: The New York Structural Biology 
Center, New York, NY 10027. Instrument: Electron Microscope, Model JEM-
3200FSC. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 71 
FR 42631.
Docket Number: 06-027. Applicant: The University of Akron, Akron, OH 
44325. Instrument: Electron Microscope, Model JEM-1230. Manufacturer: 
Joel Ltd., Japan. Intended Use: See notice at 71 FR 42631.
Docket Number: 06-028. Applicant: Clarion Health Partners, 
Indianapolis, IN 46204. Instrument: Electron Microscope, Model Technai 
G2 Spirit BioTwin. Manufacturer: FEI Company, Czech Republic. Intended 
Use: See notice at 71 FR 42632.
Docket Number: 06-029. Applicant: U.S. Department of Commerce, National 
Institute of Standards and Technology, MD 20899. Instrument: 
Aberration-Corrected Monochromated Electron Microscope, Model ACEM: 
Technai G3 TF30CSP. Manufacturer: FEI Company, The Netherlands . 
Intended Use: See notice at 71 FR 42632.
Docket Number: 06-030. Applicant: Florida State University, Department 
of Biological Science, Tallahassee, FL 32306 Instrument: Electron 
Microscope, Model Nova 400 NanoSEM. Manufacturer: FEI Company, Czech 
Republic. Intended Use: See notice at 71 FR 42632.
Docket Number: 06-031. Applicant: Jackson State University, Jackson, MI 
18540. Instrument: Electron Microscope, Model JEM-1011 Manufacturer: 
JEOL Ltd., Japan. Intended Use: See notice at 71 FR 42632.
Docket Number: 06-032. Applicant: Smithsonian Institution, National 
Museum of Natural History, Washington DC 20560-0019. Instrument: 
Electron Microscope, Model Nova 600 NanoSEM. Manufacturer: FEI Company, 
Czech Republic. Intended Use: See notice at 71 FR 42632.
Docket Number: 06-033. Applicant: University of North Florida, 
Jacksonville FL 32224. Instrument: Electron Microscope, Model Quantum 
200 ESEM. Manufacturer: FEI Company, Czech Republic. Intended Use: See 
notice at 71 FR 42632.
Docket Number: 06-034. Applicant: NYS Institute for Basic Research, 
Staten Island, NY 10314. Instrument: Electron Microscope, Model H-7500. 
Manufacturer: Hitachi High-Technologies Corporation, Japan. Intended 
Use: See notice at 71 FR 42632.
Docket Number: 06-035. Applicant: Carnegie Mellon University, 
Pittsburgh, Pa 15213. Instrument: Electron Microscope, Model Nova 600 
NanoLab Dual Beam. Manufacturer: FEI Company, The Netherlands. Intended 
Use: See notice at 71 FR 42632.
Docket Number: 06-036. Applicant: Texas Tech University, Health 
Sciences Center, Lubbock, TX 79430. Instrument: Electron Microscope, 
Model H-7650-II TEM. Manufacturer: Hitachi High-Technologies 
Corporation, Japan . Intended Use: See notice at 71 FR 42632.
Docket Number: 06-038. Applicant: The Ohio State University, Campus 
Microscopy and Imaging Facility, Columbus, OH 43210. Instrument: 
Electron Microscope, Model Technai G2 Spirit BioTwin. Manufacturer: FEI 
Company, Czech Republic. Intended Use: See notice at 71 FR 42633.
Docket Number: 06-039. Applicant: University of Louisville, Speed 
School Of Engineering, Louisville, KY 40292. Instrument: Electron 
Microscope, Model Technai G2 F-20 X-TWIN. Manufacturer: FEI Company, 
The Netherlands. Intended Use: See notice at 71 FR 42633.
Docket Number: 06-040. Applicant: UC Irvine Medical Center, Orange, CA, 
92868. Instrument: Electron Microscope, Model Technai G2 Spirit. 
Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 
71 FR 42633.
Docket Number: 06-042. Applicant: The University of Illinois at Urbana-
Champaign, Champaign, IL 61820. Instrument: Electron Microscope, Model 
JEM-220FS with STEM & Monochrometer. Manufacturer: JEOL Ltd., Japan. 
Intended Use: See notice at 71 FR 42633.
Docket Number: 06-043. Applicant: SUNY Upstate Medical University, 
Syracuse, NY 13210. Instrument: Electron Microscope, Model JEM-2100. 
Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 42633.
Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as these instruments are intended to be used, was being 
manufactured in the United States at the time the instruments were 
ordered. Reasons: Each foreign instrument is an electron microscope and 
is intended for research or scientific educational uses requiring an 
electron microscope. We know of no electron microscope, or any other 
instrument suited to these purposes, which was being manufactured in 
the United States at the time of order of each instrument.

Gerald A. Zerdy,
Program ManagerStatutory Import Programs Staff.
[FR Doc. 06-7935 Filed 9-20-06; 8:45 am]
BILLING CODE 3510-DS-S