[Federal Register Volume 71, Number 85 (Wednesday, May 3, 2006)]
[Notices]
[Page 26048]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: E6-6677]


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DEPARTMENT OF COMMERCE

International Trade Administration


Applications for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat. 
897; 15 CFR part 301), we invite comments on the question of whether 
instruments of equivalent scientific value, for the purposes for which 
the instruments shown below are intended to be used, are being 
manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be filed within 20 days with the Statutory Import 
Programs Staff, U.S. Department of Commerce, Washington, DC 20230. 
Applications may be examined between 8:30 a.m. and 5 p.m. in Suite 
4100W, U.S. Department of Commerce, Franklin Court Building, 1099 14th 
Street, NW, Washington, DC
    Docket Number: 06-015. Applicant: University of Kentucky, 
Department of Chemistry, 235 Chem-Phys. Bldg., Lexington, KY 40506-
0055. Instrument: Optical Parametric Oscillator System. Manufacturer: 
GWU Lasertechnik, Germany. Intended Use: The instrument is intended to 
be used to study small silicon, germanium, phosphorus and boron 
containing molecules in the gas phase using the technique of laser-
induced fluorescence to develop methods for identifying and 
characterizing these molecules and to determine their molecular energy 
levels and geometries and to quantify these reactive molecules in 
laboratory and industrial environments. Application accepted by 
Commissioner of Customs: March 27, 2006.
    Docket Number: 06-016. Applicant: University of Maryland, Materials 
Science and Engineering Department, Building 225, Lab 1246, College 
Park, MD 20742. Instrument: Electron Microscope, Model JEM-2100. 
Manufacturer: JEOL Ltd., Japan. Intended Use: The instrument is 
intended to be used to characterize nanomaterials and nanocomposites at 
the atomic level. These include semiconductor nanostructures, polymeric 
materials, metal nanoparticles, ferroelectric/ferromagnetic oxide 
nanocomposites and semiconductor nanowires. Properties of materials 
examined include crystal structure and quality of material, structural 
defects, and morphology using techniques of electron diffraction, high 
resolution lattice imaging, bright/dark field imaging and obtaining 
electron diffraction patterns and images of areas as small as a few 
nanometers in diameter. The instrument will also be used in courses and 
for conducting individual graduate research projects. Application 
accepted by Commissioner of Customs: April 4, 2006.
    Docket Number: 06-017. Applicant: University of Michigan, Materials 
Science and Engineering Dept., 3062 H.H. Dow Bldg., 2300 Hayward 
Street, Ann Arbor, MI 48109-2136. Instrument: Ultrasonic Fatigue 
Testing Equipment. Manufacturer: BOKU Institute of Physics, Austria. 
Intended Use: The instrument is intended to be used to study ultra-high 
cyclic fatigue behavior of materials in the gigacycle regime where 
little data is currently available. Measurements for understanding 
crack growth behavior in various materials will be obtained for aiding 
in the prediction of lifetime behavior with cyclic loading frequencies 
to 20KHz. It will also be used to characterize new materials being 
developed to perform under high cyclic loading conditions, such as next 
generation superalloys used in aircraft and power generating turbines. 
Application accepted by Commissioner of Customs: April 10, 2006.

Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. E6-6677 Filed 5-2-06; 8:45 am]
BILLING CODE 3510-DS-S