[Federal Register Volume 71, Number 85 (Wednesday, May 3, 2006)]
[Notices]
[Pages 26047-26048]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: E6-6675]


-----------------------------------------------------------------------

DEPARTMENT OF COMMERCE

International Trade Administration


University of Connecticut, et al., Notice of Consolidated 
Decision on Applications, for Duty-Free Entry of Electron Microscopes

This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be 
viewed between 8:30 a.m. and 5 p.m. in Suite 4100W, Franklin Court 
Building, U.S. Department of Commerce, 1099 14th Street, NW., 
Washington, DC.
Docket Number: 06-007. Applicant: University of Connecticut, Storrs, CT 
06269. Instrument: Electron Microscope, Model Technai G[bds2] Spirit 
BioTWIN. Manufacturer: FEI Company, The Netherlands. Intended Use: See 
notice at 71 FR 18082, April 10, 2006. Order Date: April 15, 2005.
Docket Number: 06-009. Applicant: The New York Structural Biology 
Laboratory, New York, NY 10027. Instrument: Electron Microscope, Model 
JEM-2100F. Manufacturer: JEOL Ltd., Japan.Intended Use: See notice at 
71 FR 18082, April 10, 2006. Order Date: May 26, 2005.
Docket Number: 06-010. Applicant: Emory University Hospital, Atlanta, 
GA 30322. Instrument: Electron Microscope,

[[Page 26048]]

Model Morgagni 268. Manufacturer: FEI Company, The Netherlands. 
Intended Use: See notice at 71 FR 18082, April 10, 2006. Order Date: 
September 1 2005.
Docket Number: 06-011 Applicant: President and Fellows of Harvard 
College, Cambridge, MA 02138. Instrument: Electron Microscope, Model 
JEM-2100. Manufacturer: JEOL, Ltd., Japan. Intended Use: See notice at 
71 FR 18082, April 10, 2006. Order Date: June 17, 2005.
Docket Number: 06-013. Applicant: Ames Laboratory - U.S. Department of 
Energy, Ames, Iowa 50011-3020. Instrument: Electron Microscope, Model 
Technai G[bds2] F20 X-TWIN. Manufacturer: FEI Company, The Netherlands. 
Intended Use: See notice at 71 FR 18082, April 10, 2006. Order Date: 
September 7, 2005.
Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as these instruments are intended to be used, was being 
manufactured in the United States at the time the instruments were 
ordered. Reasons: Each foreign instrument is a conventional 
transmission electron microscope (CTEM) and is intended for research or 
scientific educational uses requiring a CTEM. We know of no CTEM, or 
any other instrument suited to these purposes, which was being 
manufactured in the United States either at the time of order of each 
instrument OR at the time of receipt of application by U.S. Customs and 
Border Protection.

Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. E6-6675 Filed 5-2-06; 8:45 am]
BILLING CODE 3510-DS-S