[Federal Register Volume 71, Number 68 (Monday, April 10, 2006)]
[Notices]
[Page 18081]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: E6-5194]


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DEPARTMENT OF COMMERCE

International Trade Administration


University of Puerto Rico at Mayaguez, et al., Notice of 
Consolidated Decision on Applications for Duty-Free Entry of Electron 
Microscopes

This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be 
viewed between 8:30 a.m. and 5 p.m. in Suite 4100W, Franklin Court 
Building, U.S. Department of Commerce, 1099 14th Street, NW., 
Washington, DC.
Docket Number: 06-002. Applicant: University of Puerto Rico at 
Mayaguez. Instrument: Electron Microscope, Model JEM-2010. 
Manufacturer: JEOL, Ltd., Japan. Intended Use: See notice at71 FR 
10650, March 2, 2006. Order Date: 2/11/05.
Docket Number: 06-003. Applicant: Oklahoma State University, 
Stillwater, OK. Instrument: Electron Microscope, ModelJEM-2100F. 
Manufacturer: JEOL, Ltd., Japan. Intended Use: See notice at 71 FR 
10650, March 2, 2006. Order Date: 12/13/05.
Docket Number: 06-004. Applicant: University of North Texas . 
Instrument: Electron Microscope, Model Technai G[bds2] F20 S-TWIN. 
Manufacturer: FEI Company, The Netherlands. Intended Use: See notice at 
71 FR 10650, March 2, 2006. Order Date: 8/4/04.
Docket Number: O6-005. Applicant: University of Maryland, College Park, 
MD. Instrument: Electron Microscope, Model JEM-2100F. Manufacturer: 
JEOL, Ltd., Japan. Intended Use: See notice at 71 FR 10650, March 2, 
2005. Order Date: 4/13/05.
Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as these instruments are intended to be used, was being 
manufactured in the United States at the time the instruments were 
ordered. Reasons: Each foreign instrument is an electron microscope and 
is intended for research or scientific educational uses. We know of no 
electron microscope, or any other instrument suited to these purposes, 
which was being manufactured in the United States either at the time of 
order of each instrument OR at the time of receipt of application by 
U.S. Customs and Border Protection.

Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. E6-5194 Filed 4-7-06; 8:45 am]
Billing Code: 3510-DS-S