[Federal Register Volume 71, Number 41 (Thursday, March 2, 2006)]
[Notices]
[Pages 10649-10650]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: E6-2988]


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DEPARTMENT OF COMMERCE

International Trade Administration


Applications for Duty-Free Entry of Scientific Instruments

Pursuant to section 6(c) of the Educational, Scientific and Cultural 
Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat. 897; 15 CFR 
part 301), we invite comments on the question of whether instruments of 
equivalent scientific value, for the purposes for which the instruments 
shown below are intended to be used, are being manufactured in the 
United States.
Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations 
and be filed within 20 days with the Statutory Import Programs Staff, 
U.S. Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5 p.m. in Suite 4100W, U.S. Department 
of Commerce, Franklin Court Building, 1099 14th Street, NW., 
Washington, DC.
Docket Number: 05-059. Applicant: College of Staten Island, 2800 
Victory Blvd., Staten Island, NY 10314. Instrument: Plasma System. 
Manufacturer: Diener Electronic GmBh & Co., KG, Germany. Intended Use: 
The instrument is intended to be used to study and develop:
1. Nanotechnolgy with focused ion beams, including electronic 
properties of carbon nanowires direct written with nano-scaled ion 
beams on carbonaceous substrates
2. Micro- and nano-scale light emitting diodes on diamond, with the aim 
to develop single molecule and single

[[Page 10650]]

photon electrically driven light sources operating at room temperature
3. Development of high-pressure, high-temperature diamond anvil cells 
with internally heated anvils for hydrothermal and and shear stress 
experiments.
The instrument will also be used in courses on materials 
science.Application accepted by Commissioner of Customs: December 
20,2005.
Docket Number: 06-002. Applicant: The University of Puerto Rico at 
Mayaguez, Dept. Of Chemistry, Mayaguez, Puerto Rico 00680 Instrument: 
Electron Microscope, Model JEM-2010 Manufacturer: JEOL Ltd., Japan. 
Intended Use: The instrument is intended to be used for experimental 
studies including the characterization of gold and silver 
nanostructures, structure-property relations in semiconductor 
nanoparticles, nanowire formations and nanorods, structural fuel cell 
performance and the catalytic activity of Pt, Ru and Pt-Ru 
nanostructures, and the structure of functionalized organic-based 
nanofibers. The instrument will also be used in a variety of courses. 
Application accepted by Commissioner of Customs: January 20,2006.
Docket Number: 06-003. Applicant: Oklahoma State University, 203 
Whitehurst, Stillwater, OK 74048-3011. Instrument: Electron Microscope, 
Model JEM-2100F. Manufacturer: JEOL Ltd., Japan. Intended Use: The 
instrument is intended to be used for studies including:
1. Decomposed metal complexes at low temperatures which yield 
nanocrystalline products that are useful catalysts, electrode materials 
for batteries and supercapacitors, corrosion inhibitors, photovoltaics, 
and sorbants for pollutants.
2. Semiconducting nanoparticles (as small as 2 nm), single wall 
nanotubes and the electrical conductivity of either a semiconductor or 
a metal, depending on the diameter and helicity of the tube.
3. Virus-vector interactions in several important plant disease 
inducing viruses, that are vectored by fungi, for understanding 
emerging diseases in plants.
It will also be used for graduate student training in electron 
microscopy. Application accepted by Commissioner of Customs: January 
23, 2006.
Docket Number: 06-004. Applicant: University of North Texas, Department 
of Materials Science and Engineering, 3940 N. Elm, Research Park Room 
E132, Denton, TX 76203. Instrument: Mass Spectrometer, Model Nova 200 
NanoLab. Manufacturer: FEI Company, The Netherlands. Intended Use: The 
instrument is intended to be used in a central research facility for 
studies in materials science, chemistry, biology and physics. For 
example, in materials science and engineering, it will be used to study 
shape-memory metallic alloys, aluminum alloys for automotive uses, 
porous ceramic thin films and strained Si substrates for 
microelectronic devices, polymer nanocomposites, characterization of 
ion beam-solid interaction, optoelectronic thin films for solid state 
lighting and photovoltaic applications, and ceramic materials for low 
temperature solid oxide fuel cells. Application accepted by 
Commissioner of Customs: February 14, 2006.
Docket Number: 06-005. Applicant: University of Maryland, Materials 
Science and Engineering Department, Kim Building, Room 1237, College 
Park, MD 20742. Instrument: Electron Microscope, Model JEM-2100F. 
Manufacturer: JEOL Ltd., Japan. Intended Use: The instrument is 
intended to be used to characterize nanomaterials and nanocomposites at 
the atomic level. These include semiconductor nanostructures, polymeric 
materials, metal nanoparticles, ferroelectric/ferromagnetic oxide 
nanocomposites and semiconductor nanowires. Properties of materials 
examined include crystal structure and quality of material, structural 
defects, and morphology using techniques of electron diffraction, high 
resolution lattice imaging, bright/dark field imaging and obtaining 
electron diffraction patterns and images of areas as small as a few 
nanometers in diameter. The instrument will also be used in courses and 
for conducting individual graduate research projects. Application 
accepted by Commissioner of Customs: February 8, 2006.

Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. E6-2988 Filed 3-1-06; 8:45 am]
BILLING CODE 3510-DS-S