[Federal Register Volume 70, Number 214 (Monday, November 7, 2005)]
[Notices]
[Page 67451]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 05-22150]


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DEPARTMENT OF COMMERCE

International Trade Administration


University of California, San Diego, et al., Notice of 
Consolidated Decision on Applications for Duty-Free Entry of Scientific 
Instruments

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be 
viewed between 8:30 A.M. and 5:00 P.M. in Suite 4100W, Franklin Court 
Building, U.S. Department of Commerce, 1099 14th Street, NW, 
Washington, D.C.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instruments described below, 
for such purposes as each is intended to be used, is being manufactured 
in the United States.
    Docket Number: 05-038. Applicant: University of California, San 
Diego. Instrument: Low-Temperature Ultra-High Vacuum Scanning Tunneling 
Microscope. Manufacturer: Omicron NanoTechnology, GmbH, Germany. 
Intended Use: See notice at 70 FR 54366, September 14, 2005. Reasons: 
The foreign instrument provides: (1) a scanning tunneling microscope 
(STM) mounted inside a 4K liquid helium reservoir (8-hour time between 
liquid He refills), (2) operation at an equilibrium temperature of 4 K 
(including both tip and sample), (3) in-situ sample manipulation and 
tip transfer capabilities, (4) low drift rates of 1.0 angstrom/hour (5) 
RMS vibration amplitudes of <0.005 angstrom in a 300 Hz bandwidth and 
(6) sample surface facing downwards during STM imaging for easy dosing. 
Advice received from: A university research laboratory for advanced 
microstructures and devices.
    Docket Number: 05-039. Applicant: University of Wisconsin, Eau 
Claire. Instrument: Automatic Fusion Machine, Model Autofluxer 4. 
Manufacturer: Breitlander, GmbH, Germany. Intended Use: See notice at 
70 FR . Reasons: The foreign instrument provides dissolution of whole 
rock powder by a combination fusion/acid digestion for trace element 
analysis by ICP mass spectrometry. No apparatus of equivalent 
scientific value to the foreign apparatus, for such purposes as it is 
intended to be used, is being manufactured in the United States. This 
is a compatible accessory for an existing instrument purchased for the 
use of the applicant. The accessory is pertinent to the intended uses 
and we know of no domestic accessory which can be readily adapted for 
use with the existing instrument.
    Docket Number: 05-040. Applicant: National Renewable Energy 
Laboratory, Golden, CO, 80401. Instrument: Dual Beam Focused Ion Beam 
Electron Microscope, Model Nova 200 NanoLab. Manufacturer: FEI Company, 
The Netherlands. Intended Use: See notice at 70 FR 54366, September 14, 
2005. Reasons: The foreign instrument is an electron microscope and is 
intended for research or scientific educational uses requiring it. We 
know of no instrument suited to these purposes, which was being 
manufactured in the United States at the time of order of the 
instrument.
    We know of no other instrument or apparatus being manufactured in 
the United States which is of equivalent scientific value to any of the 
foreign instruments.

Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. 05-22150 Filed 11-4-05; 8:45 am]
BILLING CODE 3510-DS-S