[Federal Register Volume 70, Number 205 (Tuesday, October 25, 2005)]
[Notices]
[Page 61603]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: E5-5896]


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DEPARTMENT OF COMMERCE

International Trade Administration


Applications for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and, 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat. 
897; 15 CFR part 301), we invite comments on the question of whether an 
instrument of equivalent scientific value, for the purposes for which 
the instrument shown below is intended to be used, is being 
manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be filed within 20 days with the Statutory Import 
Programs Staff, U.S. Department of Commerce, Washington, D.C. 20230. 
Applications may be examined between 8:30 A.M. and 5:00 P.M. in Suite 
4100W, U.S. Department of Commerce, Franklin Court Building, 1099 14th 
Street, NW, Washington, D.C.
    Docket Number: 05-037. Applicant: California Institute of 
Technology, 1200 E. California Blvd., Pasadena, CA 91125. Instrument: 
Dual Beam SEM/FIB System, Model 200 Nanolab. Manufacturer: FEI Company, 
The Netherlands. Intended Use: The instrument is intended to be used to 
modify and analyze delicate nano-devices as well as to prepare more 
conventional cross-sectional thin sections for analytical electron 
microscopy. The nanostructures to be modified will largely be developed 
within Caltech's microfabrication facilitiesand the delivered software 
system will be re-written to enable more precise patterning and 
alignment of nanostructures. Metallorganic gases can be delivered to 
the sample surface through a gas manifold for metal deposition and 
etching gases can be injected to perform chemically-assisted focused 
ion etching. A laser interferometer stage will enable the alignment of 
nanostructures to existing alignment marks for a flexible 
nanofabrication system. A large variety of chemical analysis sensors 
will further extend the capabilities of the system.Application accepted 
by Commissioner of Customs: September 27, 2005.
    Docket Number: 05-044. Applicant: Tufts University, 169 Holland 
Street, Somerville, MA 02144. Instrument: Low-temperature Scanning 
Tunneling Microscope. Manufacturer: Omicron Nanotechnology, Germany. 
Intended Use: The instrument is intended to be used to study molecules 
adsorbed on metal and semiconductor surfaces at low temperature to gain 
understanding of the physisorption and chemisorption processes. The 
research is intended to: (1) obtain high-resolution images of 
moleculesadsorbed on surfaces at temperatures down to 4 Kelvin, (2) 
record conductance and vibrational data from these systems using the 
microscope's spectroscopic capabilities and (3) manipulate the 
positions of molecules using the microscope tip. Application accepted 
by Commissioner of Customs: October 5, 2005.

Gerald A. Zerdy,
Program ManagerStatutory Import Programs Staff.
[FR Doc. E5-5896 Filed 10-24-05; 8:45 am]
BILLING CODE 3510-DS-S