[Federal Register Volume 70, Number 51 (Thursday, March 17, 2005)]
[Notices]
[Page 13011]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: E5-1172]


-----------------------------------------------------------------------

DEPARTMENT OF COMMERCE

International Trade Administration


Applications for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat. 
897; 15 CFR part 301), we invite comments on the question of whether 
instruments of equivalent scientific value, for the purposes for which 
the instruments shown below are intended to be used, are being 
manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be filed within 20 days with the Statutory Import 
Programs Staff, U.S. Department of Commerce, Washington, DC 20230. 
Applications may be examined between 8:30 a.m. and 5 p.m. in Suite 
4100W, U.S. Department of Commerce, Franklin Court Building, 1099 14th 
Street, NW., Washington, DC.

    Docket Number: 00-011.
    Applicant: Johns Hopkins University, School of Medicine, Microscope 
Facility, 725 N. Wolfe Street, Physiology Building, Room G-4, 
Baltimore, MD 21205.
    Instrument: Electron microscope, Model H-7600-I.
    Manufacturer: Hitachi High-Technologies Corporation, Japan.
    Intended Use: The instrument is intended to be used to investigate:
    (1) The mechanical properties of intermediate filaments composed of 
keratin;
    (2) The structure and replication mechanism of kinoplast DNA;
    (3) The basis of bacterial gliding motility by means of slime 
expulsion in certain prokaryotic cells;
    (4) The mechanism of membrane protein delivery to the plasma 
membrane in mammalian cells;
    (5) Identification of novel genes that play critical roles in the 
development of the retina.
    Application accepted by Commissioner of Customs: February 25, 2005.

    Docket Number: 05-012.
    Applicant: University of Chicago, 933 East 56th Street, Chicago, IL 
60637.
    Instrument: Pattern Selection Trigger.
    Manufacturer: Hytec Electronics, Ltd., United Kingdom.
    Intended Use: The instrument is intended to be used, in conjunction 
with a digital computer system, for a telescope to study high-energy 
gamma-rays of astronomical origin.
    Application accepted by Commissioner of Customs: February 28, 2005.

    Docket Number: 05-013.
    Applicant: National Institute of Standards and Technology.
    Instrument: Focused Ion Beam Field Emission Scanning Electron 
Microscope, Model Nova 600 NanoLab.
    Manufacturer: FEI Company, The Netherlands.
    Intended Use: The instrument is intended to allow complex, 
chemically heterogeneous materials to be both synthesized using 
materials deposition from gas injection systems, and to be sectioned 
and ion milled using a Gallium ion beam for removal of material for 
study of the gross morphology, crystal structure and microstructure, 
chemical composition, electronic structure, and transport properties of 
materials to be measured on nanometer length scales. The phenomena of 
electron scattering, x-ray generation, beam transport, absorption and 
internal fluoresence will be studied to perform quantitative analyses 
of nanoscale materials for numerous ongoing research projects.
    Application accepted by Commissioner of Customs: March 2, 2005.

Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. E5-1172 Filed 3-16-05; 8:45 am]
BILLING CODE 3510-DS-P